Laser Scanning Micrometer Collimated Beam Design

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Solution Overview

Problem

Existing laser micrometers face accuracy and repeatability issues due to the lack of a spatial filter, leading to detection of off-axis reflected and diffracted light, and the use of larger beam diameters results in reduced precision and increased errors, especially when measuring objects with different reflectivity characteristics.

Innovation Solution

The design incorporates a rotating scanner mirror with a wedge-shaped receiver mirror and two light detecting diodes positioned between the laser and the rotating mirror, which allows for precise detection of the collimated beam and minimizes off-axis light issues, while also using a Ronchi rule with multiple data points for improved calibration and error correction.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a small spot diameter is used at the measurement area, then the device can measure smaller features, but the beam diverges to a larger diameter entering the receiver creating reduced accuracy and repeatability

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidrepeatability
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent changes the beam parameters by using a collimated beam of larger diameter instead of a diverging beam. This maintains a constant beam diameter throughout the measurement field, allowing the use of a small focal length lens while avoiding the accuracy and repeatability issues associated with focusing a diverging beam. The collimated beam approach resolves the contradiction by decoupling the spot size at the measurement area from the beam diameter at the receiver.

Inventive Principle:
Principle #35Parameter changes

2Object-affected harmful factors

If a collimated beam of larger diameter is used, then off-axis light issues are reduced, but the spot diameter becomes much larger making detection difficult and worsening accuracy

Engineering Contradiction:
Improveoff-axis light detectionVSAvoiddetection accuracy
Core Design Contradiction:
Object-affected harmful factorsVSMeasurement precision

Solution Approach 1:

The patent resolves this contradiction by changing the beam parameter from diverging to collimated, which maintains a constant diameter. This allows the system to use a small focal length lens for easy detection while still benefiting from the off-axis light rejection capability of the collimated beam configuration.

Inventive Principle:
Principle #35Parameter changes

3Device complexity

If a small focal length lens is used, then the device becomes more compact, but the beam focus becomes difficult to control reducing measurement precision

Engineering Contradiction:
Improvedevice compactnessVSAvoidfocus control accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent resolves this contradiction by changing the beam from diverging to collimated. This parameter change allows the use of a small focal length lens without the associated focus control difficulties, as the collimated beam maintains a constant diameter and does not require precise focusing to maintain measurement accuracy.

Inventive Principle:
Principle #35Parameter changes

4Measurement precision

If calibration is performed with a Ronchi rule, then optical errors can be corrected, but a much larger line and gap spacing is needed reducing the number of lookup table values

Engineering Contradiction:
Improveoptical error correctionVSAvoidlookup table resolution
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The patent resolves this contradiction by changing the beam parameter to collimated, which allows for a smaller spot diameter at the measurement area. This enables the use of finer line and gap spacing in the Ronchi rule calibration target, thereby increasing the number of lookup table values and improving optical error correction resolution.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly enhances measurement accuracy across the measurement region, reduces errors, and allows for precise detection of small spot diameters, even in the presence of optical defects, thereby improving the overall performance of the laser micrometer.

Implementation Method 1

a laser shining a beam on a rotating scanner mirror

Methodology Applied
Scientific EffectLaser: Laser

Implementation Method 2

the rotating scanner mirror scatters light which divides in an arc into a collimating lens

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 3

creating a collimated scanning beam

Methodology Applied
Scientific EffectCollimation: Lens

Implementation Method 4

two light detecting diodes positioned between the laser and the rotating mirror

Methodology Applied
Scientific EffectPhotoelectric Effect: Photoelectric Effect

Data Source

PatentUS9097513B2Optical laser scanning micrometer
Publication Date: 2015.08.04 NORDSON CORP
  • US9097513B2 patent drawing
  • US9097513B2 patent drawing
  • US9097513B2 patent drawing

AI summary

The present invention provides multiple improvements to optical-based laser scanning micrometers and providing a small handheld version laser scanning micrometer based on the these improvements. For added accuracy and reduction in unit size, a double sided coated mirror receiver reflects the beam back into the transmitter light source. For added accuracy, a Ronchi rule is repositioned one or more times to calibrate additional lookup table correction values. To compensate for barometric pressure change and temperature, two additional reference edges are added to be combined with the reference edges in the transmitter to generate to null out pressure and temperature at the passline measurement area. To minimize beam errors and for part locating, a third derivative is detected. Two or more parallel scanning beams are generated to null out cosine errors and to measure, taper and spherical parts.