Laser Scanner Field Correction via Scatter Pattern Calibration

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Solution Overview

Problem

Conventional laser scanner devices face challenges in achieving precise scanning field correction due to non-linear mechanical motion sequences, leading to distortion errors, which require time-consuming and inaccurate experimental methods for determining pre-distortion functions.

Innovation Solution

A method involving a scatter pattern element and photodiodes to detect scatter radiation, creating a contour diagram that allows for the calculation of a calibration function for the deflection unit, enabling automatic and precise scanning field correction without the need for external calibrating lasers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional experimental methods are used to determine pre-distortion functions, then measurement precision can be achieved, but the process becomes extremely time consuming

Engineering Contradiction:
Improvescanning field correction precisionVSAvoidcalibration time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The laser scanner device performs self-calibration by using its own processing laser beam to scan the scatter pattern element and detect scatter radiation. The device determines its own pre-distortion function without requiring external measuring machines or manual measurement, thereby reducing calibration time while maintaining precision.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces manual mechanical measurement methods with an automated optical detection system. Instead of using coordinate measuring machines or manual eye measurement, the system uses photodiodes to detect scatter radiation and automatically calculates the pre-distortion function through computational processing.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Device complexity

If manual measurement methods are used, then device complexity is reduced, but measurement precision deteriorates

Engineering Contradiction:
Improvecalibration system complexityVSAvoidscanning field correction precision
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The scatter pattern element serves multiple functions: it acts as both the calibration target and the reference standard. The element is scanned by the laser beam, and the scattered radiation provides the data needed to determine the pre-distortion function. This multi-functionality reduces the need for separate calibration equipment while maintaining high measurement precision.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The scatter pattern element acts as an intermediary between the laser beam and the detection system. It converts the laser beam's scanning path information into detectable scatter radiation patterns, which then serve as the basis for calculating the pre-distortion function. This intermediary approach enables precise automated measurement without complex calibration equipment.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If external measuring machines are used for calibration, then measurement precision can be achieved, but the calibration process becomes extremely time consuming

Engineering Contradiction:
Improvescanning field correction precisionVSAvoidcalibration efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The laser scanner device performs self-calibration by using its own processing laser beam to scan the scatter pattern element and detect scatter radiation. The device determines its own pre-distortion function without requiring external measuring machines or manual measurement, thereby reducing calibration time while maintaining precision.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The scatter pattern element is prepared in advance with a known reference pattern that encodes the desired scanning trajectory information. This preliminary preparation allows the element to contain all necessary calibration information, enabling rapid automated measurement without requiring complex external equipment or time-consuming measurement processes.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method enables high-precision, simple, and reproducible scanning field correction, reducing user effort and minimizing external influences, while allowing for direct calibration using the processing laser beam, thus improving accuracy and reducing calibration time.

Implementation Method 1

detecting scatter radiation, which can be generated by scattering and/or reflection of the laser beam

Methodology Applied
Scientific EffectScattering: Scattering

Implementation Method 2

detecting scatter radiation, which can be generated by scattering and/or reflection of the laser beam

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS20240231081A9Method for scanning field correction at least of a laser scanner device, laser scanner device, scatter pattern element, scatter pattern holding device and scanning field correction system
Publication Date: 2024.07.11 NOVANTA EURO GMBH
  • US20240231081A9 patent drawing
  • US20240231081A9 patent drawing
  • US20240231081A9 patent drawing

AI summary

The invention relates to a method for scanning field correction at least of a laser scanner device (300), wherein the method comprises the following steps: —providing a scatter pattern element (30) on a processing plane (11), wherein the scatter pattern element (30) comprises at least one scatter region (31) which is arranged in a scatter pattern (M); —passing over or scanning at least one part of the scatter pattern element (30) on the processing plane (11) by means of a laser beam (12) of the at least one laser scanner device (300) along scanner coordinates (x, y, z), wherein the laser beam passes through at least one window (20), preferably protective glass, between a deflection unit (10) and the processing plane (11); —detecting scatter radiation (13) which can be generated by scattering and/or reflection of the laser beam (12) when passing over or scanning the at least one scatter region (31); —creating a contour diagram (K) by correlating the detected scatter radiation (13) with the scanner coordinates (x, y, z); —comparing the contour diagram (K) with a reference image of the scatter pattern (M) and determining a deviation of the contour diagram (K) from the reference image of the scatter pattern (M); —calculating a calibration function for calibrated control of the deflection unit (10) on the basis of the determined deviation.