Laser Process Sensor Filtering for High-Resolution Error Detection
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Solution Overview
Problem
Existing laser machining process monitoring systems suffer from low spectral resolution and crosstalk due to broadband measurement channels, leading to undetectable or ineffective error detection in laser machining processes.
Innovation Solution
A sensor device with a filter module that adjusts partial wavelength ranges for individual detection in separate measurement channels, allowing for higher spectral resolution and precise monitoring by using a filter module upstream of the sensor unit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If broadband measurement channels are used for process monitoring, then the sensor unit can be used universally for different applications, but the spectral resolution is reduced and error detection precision deteriorates
Solution Approach 1:
The patent divides the broadband measurement channel into multiple narrowband measurement channels, each with a specific wavelength range. This segmentation allows the sensor unit to achieve high spectral resolution while maintaining versatility through configurable channel combinations for different applications.
Solution Approach 2:
The patent implements dynamic configurability where measurement channels can be individually enabled or disabled based on the specific laser machining application. This allows the system to adapt between broadband and narrowband modes, resolving the contradiction between versatility and precision.
2Device complexity
If broadband measurement channels are used, then the device structure remains simple, but crosstalk between different wavelength ranges occurs and error detection effectiveness is reduced
Solution Approach 1:
By segmenting the broadband channel into narrowband channels with specific wavelength ranges, the patent eliminates crosstalk between different wavelength ranges. Each narrowband channel detects only its designated wavelength range, improving error detection reliability while maintaining a relatively simple device structure.
Solution Approach 2:
The patent introduces wavelength-selective beam splitters as intermediary elements that direct different wavelength ranges to specific photosensors. This intermediary mechanism prevents crosstalk and enables reliable error detection while keeping the overall device structure manageable.
3Measurement precision
If narrowband measurement channels are implemented for precise error detection, then spectral resolution improves, but the sensor unit loses versatility and requires replacement for different applications
Solution Approach 1:
The patent designs the sensor unit with multiple narrowband measurement channels that can be individually configured. By enabling or disabling specific channels, the same sensor unit can be adapted to different laser machining applications, achieving both high spectral resolution and versatility without requiring replacement.
Solution Approach 2:
The patent implements dynamic channel configuration that allows the sensor unit to switch between different narrowband measurement modes. This dynamic adaptability enables precise error detection for specific applications while maintaining the ability to reconfigure for other applications, eliminating the need for sensor unit replacement.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise detection of process errors by individually amplifying sensor signals in specified wavelength ranges, enhancing the ability to detect material-specific emissions and adapt to different laser machining processes.
Implementation Method 1
at least one filter module (32) configured to filter a process beam (16) generated during the execution of the laser machining process
Implementation Method 2
a sensor unit (28) for detecting an intensity of the filtered process beam in at least two measurement channels
Implementation Method 3
The process beam is split into partial beams, each with a different wavelength range, by a beam splitter arrangement with one or more beam splitters with a wavelength-selective coating
Data Source
AI summary
A sensor device for monitoring a laser machining process is provided. The sensor device includes at least one filter module for filtering a process beam generated during the execution of the laser machining process, and a sensor unit for detecting an intensity of the filtered process beam in at least two measurement channels by at least two photosensors. The filter module is configured to adjust at least one partial wavelength range of the process beam that is detectable in one of the measurement channels of the sensor unit. A laser machining system with the sensor device is also provided.