Laser Process Optical Signal Analysis for Real-Time Abnormality Detection

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing methods for detecting laser process abnormalities in battery manufacturing are inefficient and require significant time and resources, especially when product models change or maintenance is performed, leading to increased lead times and material loss.

Innovation Solution

An apparatus and method that mathematically analyze optical signals generated during the laser process using instantaneous and longitudinal change analysis processes, with predefined normal and risk ranges, to accurately detect abnormalities in real-time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional methods are used for detecting laser process abnormalities, then comprehensive analysis can be performed, but the detection time is long and productivity is reduced

Engineering Contradiction:
Improveabnormality detection accuracyVSAvoiddetection speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent segments the optical signal analysis into two independent components: instantaneous change analysis (comparing current signal to reference) and longitudinal change analysis (comparing different time points within the same signal). This segmentation allows parallel processing of multiple analysis tasks, reducing overall detection time while maintaining comprehensive abnormality detection capability

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent performs preliminary action by pre-storing reference optical signals from normal laser processes and pre-defining abnormality determination criteria. During actual detection, the system directly compares acquired signals against pre-prepared references and criteria, eliminating the need for real-time comprehensive analysis and significantly reducing detection time

Inventive Principle:
Principle #10Preliminary action

2Reliability

If traditional analysis methods are used, then thorough process monitoring is achieved, but significant time and resources are consumed

Engineering Contradiction:
Improveprocess monitoring reliabilityVSAvoidanalysis time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent extracts only the essential features needed for abnormality detection: instantaneous changes (deviations from reference) and longitudinal trends (changes over time). By extracting only these critical features rather than performing comprehensive full-signal analysis, the system achieves reliable monitoring with significantly reduced computation time and resource consumption

Inventive Principle:
Principle #2Taking out (Extraction)

3Adaptability or versatility

If product models change or maintenance is performed, then process adaptation is needed, but lead time increases and material loss occurs

Engineering Contradiction:
Improveprocess adaptabilityVSAvoidlead time
Core Design Contradiction:
Adaptability or versatilityVSLoss of time

Solution Approach 1:

The patent enables rapid adaptation to product model changes or maintenance events by simply changing the reference optical signal parameters. When a model change occurs, new reference signals are acquired and stored; when maintenance is performed, the reference library is updated. This parameter-based adaptation approach allows quick reconfiguration without extensive recalibration, reducing lead time and preventing material loss

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Reduces the time required for abnormality detection and increases accuracy by mathematically interpreting optical signals, allowing for precise identification of defective products.

Implementation Method 1

a sensor module configured to acquire an optical signal generated during a laser process of a target

Methodology Applied
Scientific EffectOptical signal generation: Light

Data Source

PatentEP4700367A1Apparatus and method for analysing a process abnormality of a laser process
Publication Date: 2026.02.25 SAMSUNG SDI CO LTD
  • EP4700367A1 patent drawingFigure 1
  • EP4700367A1 patent drawingFigure 2
  • EP4700367A1 patent drawingFigure 3

AI summary

An apparatus and a corresponding method for analyzing a laser process, the apparatus including a sensor module (100) configured to acquire an optical signal generated during a laser process of a target, and a processor (300) configured to detect an abnormality of the laser process through an instantaneous change analysis process of the optical signal performed whenever the optical signal is acquired by the sensor module (100), and a longitudinal change analysis process of the optical signal performed at a time point when a target time section ends, the target time section being a time during which the laser process is performed.