On-Machine Laser Measurement Device for Surface Fine Structure
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Solution Overview
Problem
Conventional measurement devices face difficulties in precisely measuring the surface fine structure of a target machined by a machine tool, especially in the depth direction, and are susceptible to the physicochemical properties of cutting fluids, limiting their ability to evaluate surface smoothness effectively.
Innovation Solution
An on-machine measurement device that uses a laser source, a moving mechanism, a half mirror, a lens, a projection plane, a light-receiving element array, an A/D converter, and a calculator to generate an optical diffraction image and acquire beam intensity distribution, allowing for precise measurement of surface fine structures in the depth direction, even on surfaces coated with cutting fluids.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional measurement devices directly observe the surface of a measurement target, then the measurement process is simple, but the measurement is susceptible to influence by the physicochemical properties of cutting fluid
Solution Approach 1:
The patent introduces light as an intermediary medium to measure the surface of the workpiece. By using laser beam irradiation and analyzing the reflected or scattered light, the measurement can be performed without direct contact with the workpiece surface, thereby avoiding the harmful effects of cutting fluid on the measurement accuracy.
Solution Approach 2:
The patent replaces conventional direct mechanical observation methods with optical measurement techniques. Instead of using mechanical sensors or direct visual inspection that are affected by cutting fluid, the system uses laser irradiation and light detection to obtain surface information, substituting the mechanical observation system with an optical one that is immune to cutting fluid interference.
2Measurement precision
If conventional measurement techniques are used, then the device structure is simple, but the ability to precisely measure surface fine structure in the depth direction is insufficient
Solution Approach 1:
The patent transitions from two-dimensional surface observation to three-dimensional surface profiling by analyzing the depth information contained in the scattered and reflected laser beams. The light-receiving element array captures intensity distribution that encodes depth information, enabling precise measurement of surface fine structures in the depth direction through optical path analysis.
Solution Approach 2:
The patent divides the measurement function into multiple specialized components: laser source for irradiation, half mirror for beam direction control, lens for focusing scattered beams, light-receiving element array for intensity detection, and calculator for processing. This segmentation allows each component to be optimized for its specific function, achieving high measurement precision while maintaining reasonable device complexity.
3Measurement precision
If scanning irradiation with laser beam is implemented, then the beam intensity distribution can be acquired, but the device complexity increases due to multiple components
Solution Approach 1:
The patent designs the measurement device where each component serves multiple functions. For example, the light-receiving element array both detects the intensity distribution of scattered light and captures spatial information for generating optical diffraction images. The calculator both processes raw detection data and generates final measurement results. This multi-functionality reduces the need for additional specialized components.
Solution Approach 2:
The patent combines several measurement functions into an integrated optical path: the laser source, half mirror, lens, and light-receiving element array are arranged to form a unified scanning and detection system. The beam path is merged through the half mirror and lens to focus scattered light onto the light-receiving element array, creating a compact integrated system that achieves precise beam intensity distribution acquisition without requiring separate independent systems for each function.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise measurement of surface fine structures in the depth direction, providing accurate visualization of surface roughness and geometric dimensions, unaffected by cutting fluids, and applicable to both planar and curved surfaces.
Implementation Method 1
a laser source (laser source 20 described later, for example) that emits a laser beam
Implementation Method 2
a lens (lens 32 described later, for example) that focuses the beam scattered, diffracted, and reflected on the measurement target
Implementation Method 3
a light-receiving element unit (light-receiving element array 41 described later, for example) that converts an optical signal at the projection plane to an electrical signal
Data Source
AI summary
An on-machine measurement device comprises: a moving mechanism that makes scanning irradiation with a laser beam by moving a cutting target as a measurement target relative to a laser source; a half mirror that causes the beam from the laser source to enter the cutting target vertically; a lens that focuses the beam scattered, diffracted, and reflected on the cutting target; a projection plane for a focal image of the beam having passed through the lens; a light-receiving element array that converts an optical signal at the projection plane to an electrical signal and outputs an analog signal; and a calculator that stores received beam information in chronological order acquired by the light-receiving element array, converts the received beam information stored in chronological order to space information to generate an optical diffraction image, and acquires a beam intensity distribution based on the generated optical diffraction image.