Surface-Emitting Laser Testing Using Dual-Voltage Segmentation
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Solution Overview
Problem
Current methods for testing surface-emitting lasers using direct-current voltage are insufficient for determining conformity or defects, and applying alternating-current voltage requires a longer time, leading to prolonged testing processes.
Innovation Solution
A method and apparatus that measure laser beams from surface-emitting lasers using both direct-current and alternating-current voltages, where a subset of lasers are tested with alternating-current voltage to reduce overall testing time by minimizing the number of lasers requiring this longer measurement process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If alternating-current voltage is applied to measure laser beams for determining conformity or defects, then measurement accuracy is improved, but testing time is prolonged
Solution Approach 1:
The patent segments the laser array into multiple groups, applying alternating-current voltage only to specific groups (e.g., every k-th laser or lasers at edge positions) rather than all lasers. This segmentation allows the system to maintain measurement accuracy for critical lasers while reducing overall testing time by excluding non-critical lasers from the time-consuming alternating-current measurement process.
Solution Approach 2:
The patent applies different measurement qualities to different locations within the laser array. Edge-position lasers or specifically selected lasers receive the more accurate but time-consuming alternating-current voltage measurement, while other lasers receive only the faster direct-current voltage measurement. This local differentiation of measurement quality optimizes the balance between accuracy and speed.
2Loss of time
If direct-current voltage is applied to measure laser beams, then testing time is reduced, but determination of conformity or defects is insufficient
Solution Approach 1:
The patent implements a two-tier measurement segmentation: all lasers receive rapid direct-current voltage measurement for initial screening, while a subset of lasers (edge-position or specifically selected) additionally receive alternating-current voltage measurement for definitive conformity determination. This segmentation enables time reduction for the majority of lasers while maintaining accuracy for critical cases.
Solution Approach 2:
The patent applies partial action by using direct-current voltage measurement for all lasers (sufficient for initial assessment) and adding alternating-current voltage measurement only where necessary (edge positions or selected lasers). This partial application of the more accurate method achieves sufficient determination accuracy while minimizing time loss.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces the time required for testing surface-emitting lasers by completing the measurement of laser beams emitted under alternating-current voltage more efficiently, thereby streamlining the testing process.
Implementation Method 1
measuring a first laser beam emitted from each of an n number of surface-emitting lasers among the plurality of surface-emitting lasers, the first laser beam being emitted when a direct-current voltage is applied to each of the n number of surface-emitting lasers
Data Source
AI summary
In a method of manufacturing surface-emitting lasers, a substrate having a major surface including a plurality of areas each provided with a plurality of surface-emitting lasers is prepared. A first laser beam emitted when a direct-current voltage is applied to each of an n number of surface-emitting lasers among the plurality of surface-emitting lasers is measured, n being an integer of 2 or greater. A second laser beam emitted when an alternating-current voltage is applied to each of an m number of surface-emitting lasers among the plurality of surface-emitting lasers is measured, m being a natural number smaller than n. Whether the n number of surface-emitting lasers are each conforming or defective is determined from a result of the measurement of the first laser beam. Whether the m number of surface-emitting lasers are each conforming or defective is determined from a result of the measurement of the second laser beam.