Laser Weld Feedback Control Using Return Light Waveforms
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Solution Overview
Problem
Existing laser welding systems struggle to maintain weld quality due to various fluctuation factors, including weld width and depth, which are not adequately addressed by existing technologies.
Innovation Solution
A laser processing system that includes a light detector to capture thermal radiation, visible light, and reflected light, generating waveform data to extract feature values, and adjusts parameters such as laser focal position, scanning speed, and energy distribution based on these values to stabilize weld quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If existing laser welding systems are used, then welding operations can be performed, but weld quality cannot be maintained due to fluctuation factors such as weld width and depth
Solution Approach 1:
The system detects return light from the workpiece during laser processing, generates waveform data, extracts feature values, and feeds this information back to automatically adjust processing parameters. This closed-loop feedback mechanism maintains weld quality by compensating for fluctuations in real-time, directly resolving the contradiction between manufacturing precision and reliability.
Solution Approach 2:
The system dynamically changes processing parameters (laser power, scanning speed, focal position) based on extracted feature values from waveform data. By continuously adjusting parameters in response to detected variations, the system maintains consistent weld quality and depth despite fluctuation factors, resolving the contradiction between precision and reliability.
2Measurement precision
If laser processing is performed without real-time monitoring, then processing speed is maintained, but abnormalities in welding cannot be accurately detected
Solution Approach 1:
The system introduces a light detector as an intermediary component that captures return light from the workpiece. This intermediary enables indirect measurement of welding conditions through optical detection, achieving high measurement precision for detecting abnormalities without requiring direct physical contact or complex sensing mechanisms at the welding zone.
Solution Approach 2:
The system replaces complex mechanical measurement systems with optical detection using a light detector and waveform analysis. By substituting mechanical sensing with optical field-based detection and signal processing, the system achieves high detection accuracy while managing device complexity through software-based analysis rather than additional mechanical components.
3Manufacturing precision
If processing parameters are fixed, then operational simplicity is maintained, but weld quality varies due to fluctuation factors
Solution Approach 1:
The system performs self-adjustment of processing parameters by automatically detecting waveform characteristics, extracting feature values, and modifying laser processing parameters without external intervention. This self-service capability maintains weld quality consistency while preserving operational simplicity, as the system autonomously compensates for fluctuations without requiring operator involvement in parameter tuning.
Solution Approach 2:
The system transitions from fixed parameters to dynamic parameter adjustment, where processing parameters are continuously modified based on real-time waveform analysis. This dynamic approach maintains weld quality consistency by adapting to fluctuation factors, while the automation of this process preserves ease of operation by eliminating the need for manual parameter management.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system improves weld quality by accurately detecting abnormalities and adjusting parameters to maintain consistent weld characteristics, reducing defects like spattering and enhancing overall processing precision.
Implementation Method 1
a light detector that detects return light including at least one of thermal radiation, visible light, or reflected light
Implementation Method 2
return light including at least one of thermal radiation, visible light, or reflected light
Data Source
AI summary
A laser processing system of the present disclosure includes a laser processing device that irradiates a workpiece with laser light, a light detector that detects return light including at least one of thermal radiation, visible light, or reflected light, the return light being generated by irradiating the workpiece with the laser light, and a controller that controls the laser processing device, in which the controller is configured to generate waveform data indicating an intensity of the return light during processing of the workpiece based on the return light detected by the light detector, extract a feature value from the waveform data, specify a first parameter having change among a plurality of parameters related to processing of the laser processing device based on the feature value, and change a second parameter among the plurality of parameters based on the first parameter.


