Latch Comparison Circuit for Semiconductor Failure Detection
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Solution Overview
Problem
Existing integrated circuit testing methods fail to effectively identify and diagnose failures in latch circuits, which are crucial for data storage and signal synchronization, leading to potential errors and inefficiencies in semiconductor device operations.
Innovation Solution
A semiconductor device and method that includes a latch comparison circuit for generating latched addresses and comparison signals based on test mode signals and select signals, and a failure flag generation circuit to detect discrepancies, enabling the identification of latch circuit failures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If existing integrated circuit testing methods are used, then the testing process is simple, but latch circuit failures cannot be effectively identified and diagnosed
Solution Approach 1:
The testing circuit is segmented into distinct functional modules: a latch comparison circuit that compares pattern signals with latched addresses, and a failure flag generation circuit that generates diagnostic flags. This segmentation allows the complex testing function to be broken down into manageable, specialized components that can be independently designed and analyzed.
Solution Approach 2:
The latch comparison circuit acts as an intermediary between the pattern signal input and the failure detection mechanism. It introduces comparison functionality that mediates between the input signals and the latched addresses, enabling precise failure identification without requiring direct complex interaction between all testing components.
2Reliability
If latch circuit testing is not implemented, then the device complexity is low, but errors and inefficiencies in semiconductor device operations occur
Solution Approach 1:
The testing circuit performs preliminary detection of latch circuit failures before they propagate to cause operational errors. By implementing the latch comparison and failure flag generation in advance, the system can identify and flag potential issues before they affect semiconductor device reliability, preventing errors rather than merely detecting them after occurrence.
3Measurement precision
If comprehensive latch circuit testing is implemented, then failure detection accuracy is improved, but the testing time increases
Solution Approach 1:
The patent replaces complex mechanical or sequential testing mechanisms with an electronic comparison-based system. The latch comparison circuit uses electronic signal comparison between pattern signals and latched addresses, which occurs at electronic speeds rather than mechanical testing speeds, thereby reducing testing time while maintaining high detection accuracy.
Data Source
AI summary
A semiconductor device may be provided. The semiconductor device may include a latch comparison circuit configured for generating a latched address by latching a pattern signal inputted through an address, and generate a comparison signal by comparing a pattern signal inputted through the address and the latched address. The semiconductor device may include a failure flag generation circuit configured for generating a failure flag signal based on the comparison signal.