Latchup Diode Circuit for X-Ray Attack Prevention in ICs
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Solution Overview
Problem
Existing methods for securing integrated circuits against active x-ray attacks, such as package shielding, are prone to tampering and fail to prevent the determination of key technology and intellectual property, as they can be bypassed or compromised through backside attacks using scanning electron microscopes.
Innovation Solution
Incorporating latchup sensitive diode circuits, particularly P-N diode circuits, in close proximity to functional circuits to induce a latchup condition when exposed to x-ray illumination, thereby preventing the determination of functional states and theft of intellectual property by causing local circuit damage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If package shielding is used to prevent x-ray attacks, then security against external attacks is improved, but the device remains vulnerable to tampering and backside attacks
Solution Approach 1:
The patent converts the harmful effect of x-rays into a beneficial security mechanism. When x-rays illuminate the circuit, they generate excess charge carriers that trigger parasitic bipolar transistors into latchup mode, thereby transforming the external attack vector into an internal protection mechanism that automatically activates upon detection of the attack condition
2Reliability
If latchup sensitive diode circuits are placed in proximity to functional circuits, then active x-ray attack prevention is achieved, but device complexity increases
Solution Approach 1:
The patent merges the protection function with the existing functional circuit layout by placing latchup-sensitive diode circuits in close proximity to functional circuits. This integration approach allows the security mechanism to share physical space and electrical infrastructure with the functional circuits, thereby reducing overall device complexity compared to separate protection systems
Solution Approach 2:
The latchup-sensitive diode circuits serve multiple functions: they act as both the functional circuit elements and the security protection mechanism. The same circuit structures that perform computational or logical functions also serve as the trigger mechanism for x-ray attack detection and response, eliminating the need for dedicated separate protection circuits
3Reliability
If latchup condition is induced to prevent key theft, then intellectual property protection is improved, but functional circuit operation is disrupted
Solution Approach 1:
The patent applies preliminary anti-action by pre-positioning latchup-sensitive diode circuits throughout the functional circuit layout. These circuits are prepared in advance to immediately trigger latchup conditions when x-ray illumination is detected, preventing the attack before any key extraction or intellectual property compromise can occur
Solution Approach 2:
The protection mechanism is activated in advance by the physical presence and strategic placement of latchup-sensitive diode circuits within the functional circuit. The circuits are pre-configured to respond automatically upon x-ray exposure, ensuring that protection is already in place before any potential attack occurs
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively prevents active x-ray attacks by inducing a latchup condition in integrated circuits, rendering them useless and protecting key technology and intellectual property from unauthorized access.
Implementation Method 1
a P-N diode circuit to induce a cascading latchup condition and is cascaded in a predetermined proximity of the functional circuits across the chip
Implementation Method 2
at least one latchup sensitive diode circuit configured to induce a latchup condition in the functional circuit
Data Source
AI summary
The present disclosure relates to an active x-ray attack prevention structure for secure integrated circuits. In particular, the present disclosure relates to a structure including a functional circuit, and at least one latchup sensitive diode circuit configured to induce a latchup condition in the functional circuit, placed in proximity of the functional circuit.