Lateral Heterojunction Bipolar Transistor Gate Structure

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Solution Overview

Problem

Bipolar junction transistors (BJT) have lagged behind CMOS devices in performance advancements, particularly in operating frequency, and are not well-suited for low-voltage applications required by emerging technologies like the Internet of Things (IoT).

Innovation Solution

The method involves forming lateral heterojunction bipolar devices by creating specific gate structures and base contacts on an active semiconductor layer, including forming a first gate structure, a second gate structure adjacent to the first, and a third gate structure, with emitter and collector regions defined between these structures, and base contacts established to define the base of the bipolar transistor.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If conventional BJT structures are used, then device performance is maintained at traditional levels, but operating frequency and low-voltage suitability lag behind CMOS devices

Engineering Contradiction:
Improveoperating frequencyVSAvoidperformance advancement
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent transitions from conventional vertical BJT structures to lateral heterojunction bipolar transistor structures. This dimensional change reorients the current flow and device geometry, allowing the BJT to achieve higher operating frequencies and better low-voltage performance while maintaining the fundamental bipolar transistor operation principles

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Ease of manufacture

If conventional vertical BJT structures are used, then fabrication processes are well-established, but the devices are not well-suited for low-voltage applications

Engineering Contradiction:
Improvefabrication process maturityVSAvoidlow-voltage application suitability
Core Design Contradiction:
Ease of manufactureVSAdaptability or versatility

Solution Approach 1:

The patent modifies key structural parameters of the BJT by implementing lateral heterojunction configurations with specific gate structures, base contacts, and emitter-collector arrangements. These parameter changes enable the device to operate effectively at lower voltages while utilizing adapted fabrication processes that build upon conventional techniques

Inventive Principle:
Principle #35Parameter changes

3Device complexity

If traditional BJT designs are used, then device simplicity is maintained, but performance gap with CMOS devices increases

Engineering Contradiction:
Improvestructure simplicityVSAvoidoperating frequency
Core Design Contradiction:
Device complexityVSSpeed

Solution Approach 1:

The patent segments the BJT structure into distinct lateral components including separate gate structures, base contacts, emitter regions, and collector regions. This segmentation allows each component to be optimized independently for high-frequency performance while maintaining an overall structure that is manufacturable and understand able

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

By transitioning to lateral structures, the patent reconfigures the spatial arrangement of BJT components, enabling improved carrier transport and reduced parasitic effects that enhance operating frequency without proportionally increasing device complexity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS11133397B2Method for forming lateral heterojunction bipolar devices and the resulting devices
Publication Date: 2021.09.28 GLOBALFOUNDRIES US INC
  • US11133397B2 patent drawing
  • US11133397B2 patent drawing
  • US11133397B2 patent drawing

AI summary

One illustrative method of forming heterojunction bipolar devices includes, among other things, forming a first gate structure above an active semiconductor layer, forming a second gate structure adjacent a first side of the first gate structure, forming a third gate structure adjacent a second side of the first gate structure, forming an emitter of a bipolar transistor in the active semiconductor layer between the first gate structure and the second gate structure, forming a collector of the bipolar transistor in the active semiconductor layer between the first gate structure and the third gate structure, and forming a first base contact contacting the active region adjacent an end of the first gate structure, wherein a portion of the active semiconductor layer positioned under the first gate structure defines a base of the bipolar transistor.