Lateral Scanning for Uniform Large Area Optical Interference
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Solution Overview
Problem
Current optical interference pattern generation systems are limited by light source non-uniformity, resulting in non-uniform interference patterns, restricting the uniform area to the size of the uniform light source.
Innovation Solution
A scanning method using two refraction blocks with planar parallel surfaces to laterally translate a light beam, ensuring continuous overlap and uniformity of the interference pattern across a larger area by moving the beam overlap area over the recording area.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If a non-uniform light source is used, then the light source can provide sufficient illumination intensity, but the resulting interference pattern is non-uniform and limited to the area of the uniform portion of the light source
Solution Approach 1:
The patent introduces dynamic scanning movement of the beam overlap area using galvanometer-controlled mirrors. The mirrors continuously move the interference pattern across the recording medium, allowing different regions of the non-uniform light source to be scanned across the same area, thereby averaging out the non-uniformity and producing a uniform large-area interference pattern.
Solution Approach 2:
The patent transforms a static two-dimensional interference pattern into a dynamic three-dimensional scanning process. By adding the time dimension through continuous scanning movement, the system overlaps multiple instances of the interference pattern from different positions, effectively converting spatial non-uniformity into temporal averaging that results in uniformity.
2Manufacturing precision
If the uniform area of the interference pattern is limited to the area of the uniform light source, then the light source non-uniformity does not affect the pattern, but the size of the uniform interference pattern area is restricted
Solution Approach 1:
The scanning mirrors dynamically move the beam overlap area across the recording medium, allowing the uniform interference pattern to be generated over a large area by continuously scanning different portions of the non-uniform light source across the same region, thereby expanding the uniform pattern area beyond the uniform light source area.
Solution Approach 2:
The continuous scanning movement ensures that every point on the recording medium is exposed to the interference pattern multiple times from different positions, maintaining continuous useful action that averages out non-uniformities and produces a uniformly patterned large area.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the generation of a uniform optical interference pattern over a large area, independent of light source non-uniformity, by continuously scanning and overlapping non-uniform areas with uniform interference patterns, thereby increasing the size of the uniformly patterned area.
Implementation Method 1
The invention uses two refraction blocks with planar parallel surfaces to laterally translate a light beam in vertical and horizontal directions
Implementation Method 2
beam splitting device of the interference pattern generating system
Data Source
AI summary
This disclosure of a scanner and method is a new way of removing non-uniformities from optical interference patterns.