Layered Micro-Channel Plate Detector for Miniature SEM Integration

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Solution Overview

Problem

Conventional charged particle detectors, such as Everhart-Thornley detectors and micro-channel plate detectors, are too large and cumbersome for miniature scanning electron microscopes, limiting their integration in tight lens spaces and resulting in poor signal-to-noise ratios due to restricted working distance and small solid angles.

Innovation Solution

A thin, layered micro-channel plate detector package with an aperture, fabricated using Low Temperature Co-Fired Ceramic technology, is designed for miniature electron beam columns, allowing high collection efficiency and minimal distortion of the incident beam, enabling improved image contrast and integration with miniature SEMs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional Everhart-Thornley detectors are used, then detection capability is provided, but detector size is large making it impractical for miniature SEM columns

Engineering Contradiction:
Improvedetection capabilityVSAvoiddetector size
Core Design Contradiction:
ReliabilityVSVolume of moving object

Solution Approach 1:

The detector is segmented into multiple thin layers (first converter layer, first MCP layer, second MCP layer, second converter layer) stacked in sequence, replacing the single bulky conventional detector structure with a compact multi-layer configuration that maintains detection capability while reducing overall volume

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple functional layers are nested within each other in a compact stack configuration, with converter layers and MCP layers alternating and integrated within a single detector package, allowing high detection efficiency in a miniature form factor suitable for tight column spaces

Inventive Principle:
Principle #7Nested doll (Nesting)

2Reliability

If dual stack MCP configuration is used to increase gain, then detector gain is improved, but working distance is restricted

Engineering Contradiction:
Improvedetector gainVSAvoidworking distance
Core Design Contradiction:
ReliabilityVSLength of moving object

Solution Approach 1:

The detector uses thin film structures for both converter layers and MCP layers, with each layer being only micrometers to sub-millimeter thick, allowing the entire dual-stack configuration to achieve high gain while maintaining a compact overall thickness that preserves adequate working distance

Inventive Principle:
Principle #30Flexible shells and thin films

Solution Approach 2:

The detector parameters are optimized by using thin MCP layers (0.4mm each) with appropriate channel aspect ratios and thin converter layers, allowing the dual-stack configuration to achieve gain of approximately 10^7 while keeping the total detector thickness under 1.3mm, thus maintaining working distance

Inventive Principle:
Principle #35Parameter changes

3Productivity

If detector is positioned close to sample, then collection efficiency is improved, but detector size must be small

Engineering Contradiction:
Improvecollection efficiencyVSAvoiddetector volume
Core Design Contradiction:
ProductivityVSVolume of moving object

Solution Approach 1:

The detector transitions from a two-dimensional planar structure to a three-dimensional stacked configuration with multiple converter and MCP layers arranged in sequence along the beam path, enabling high collection efficiency through increased solid angle coverage while maintaining a compact footprint that allows close positioning to the sample

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The thin detector package enhances SEM resolution at shorter working distances, achieving higher collection efficiency and improved image contrast while maintaining a compact form factor, suitable for miniature SEMs.

Implementation Method 1

When a voltage is applied between the top and bottom of channel plates, incident electrons are accelerated and multiplied, resulting in current gain

Methodology Applied
Scientific EffectElectron multiplication: Electron Avalanche

Implementation Method 2

A biased collector grid surrounding a scintillator material, which is coupled to a photomultiplier to provide a first stage of amplification

Methodology Applied
Scientific EffectScintillation: Scintillation

Implementation Method 3

a scintillator material, which is coupled to a photomultiplier to provide a first stage of amplification

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS8110801B2Layered scanning charged particle microscope package for a charged particle and radiation detector
Publication Date: 2012.02.07 KLA CORP
  • US8110801B2 patent drawing
  • US8110801B2 patent drawing
  • US8110801B2 patent drawing

AI summary

A scanning charged particle microscope includes a layered charged particle beam column package; a sample holder; and a layered micro-channel plate detector package located between the column package and the sample holder.