Multi-Scenario Layout-Dependent Effect Analysis for Sub-45nm Circuit Design
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Solution Overview
Problem
In modern electronic circuit design, especially at sub-45 nm nodes, layout-dependent effects such as stress effects and well-proximity effects significantly impact device performance, requiring early analysis of these effects to ensure acceptable performance and manufacturing criteria, but existing design flows often fail to capture these effects until late in the process, leading to iterative verification and redesign.
Innovation Solution
Implementing a multi-scenario physically-aware design method that captures layout-dependent effects early in the design process by generating and analyzing multiple layout alternatives for critical components, extracting parameters, and performing simulations to analyze these effects during both schematic and physical design stages, allowing for partial routing and scenario switching to optimize component placement and interconnects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If layout-dependent effects are analyzed late in the design process via extraction and re-simulation, then verification accuracy is improved, but design time and productivity deteriorate due to iterative verification and redesign
Solution Approach 1:
The patent applies preliminary action by performing layout-dependent effect analysis during the schematic design stage rather than waiting for late-stage extraction and re-simulation. The system captures layout information early, generates multiple layout alternatives, and analyzes their impact on device performance before finalizing the physical design, thereby avoiding iterative redesign cycles and reducing overall design time while maintaining verification accuracy
Solution Approach 2:
The patent implements feedback by creating a continuous loop where layout information is captured early, analyzed for layout-dependent effects, and used to guide subsequent design decisions. The system provides feedback about the impact of different layout alternatives on device performance, allowing designers to adjust schematic or layout choices based on predicted effects, thus eliminating the need for multiple iterative verification cycles
2Adaptability or versatility
If multiple layout alternatives are generated and analyzed early in the design process, then design flexibility and performance optimization are improved, but design complexity increases
Solution Approach 1:
The patent applies segmentation by dividing the layout analysis into discrete, manageable layout alternatives that can be independently generated and evaluated. Each layout alternative represents a specific configuration of critical components with defined layout contexts, allowing the system to analyze multiple scenarios without overwhelming complexity. The segmentation enables systematic comparison and selection of optimal layouts
Solution Approach 2:
The patent uses an intermediary approach by introducing a layout alternative generation and analysis system that acts as a mediator between schematic design and physical implementation. This intermediary layer captures layout information early, generates multiple alternatives, analyzes their effects, and provides guidance back to the design process, thereby managing complexity while enabling flexible exploration of design options
3Productivity
If layout-dependent effects are captured early in the design process, then the need for iterative verification is reduced, but the initial analysis complexity increases
Solution Approach 1:
The patent applies preliminary action by performing comprehensive layout-dependent effect analysis during the schematic design stage. The system captures layout information early, generates multiple layout alternatives with different configurations, and analyzes their impact on device performance before finalizing the design. This upfront analysis eliminates the need for iterative verification cycles later in the process, reducing overall productivity losses despite increased initial analysis complexity
Data Source
AI summary
Disclosed are methods, systems, and articles of manufacture for implementing multi-scenario physically-aware design of electronic circuit design(s). In some embodiments, the method captures layout dependent effect(s) when a critical component instance, which corresponds to multiple candidate configurations, is being created in a physical design to enable a designer to create partial layout(s) from layout alternative(s) and to extract parameter(s) from the partial layout(s) in different layout contexts. The method may extract parasitics between components and analyzes impact(s) of layout dependent effect(s) on an electronic design by performing simulation(s) with layout dependent effect(s) in the schematic domain and may perform some partial routing based on some routing style(s) in each of the different layout contexts to generate just enough interconnects that may affect the electronic design.