Layout-Based Side-Channel Emission Analysis for IC Leakage
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Solution Overview
Problem
Current methods for detecting side channel attacks on devices, such as smartphones or credit cards, are ineffective in preventing the extraction of sensitive information like cryptographic keys or passwords before the device is manufactured, as they rely on post-manufacturing laboratory tests that are resource-intensive and only applicable after IC fabrication.
Innovation Solution
A method that simulates dynamic voltage drop and side channel correlation analysis on integrated circuits before fabrication, allowing for the identification and reduction of sensitive data leakage by selecting critical locations for redesign, using a combination of dynamic power modeling and system-level simulations to visualize and quantify leakage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If post-manufacturing laboratory tests are used to detect side channel attacks, then detection accuracy is improved, but manufacturing time and cost increase significantly
Solution Approach 1:
The patent applies preliminary action by performing side channel correlation analysis during the IC design phase before fabrication. The method simulates power consumption and electromagnetic emissions using pre-fabrication models to identify vulnerable locations, allowing designers to implement countermeasures in the design itself rather than detecting issues after manufacturing. This shifts the detection activity from post-manufacturing to pre-manufacturing, resolving the time loss contradiction.
2Measurement precision
If comprehensive side channel analysis is performed on all IC locations, then detection accuracy is improved, but computational resources are excessively consumed
Solution Approach 1:
The patent applies segmentation by dividing the IC into discrete locations and performing side channel correlation analysis on individual locations or small groups rather than the entire IC simultaneously. The method processes locations in manageable segments, reducing computational resource consumption while maintaining comprehensive coverage through systematic segmentation of the analysis task.
Solution Approach 2:
The patent applies partial action by initially performing analysis on a subset of critical locations identified through design characteristics, rather than exhaustively analyzing every single location. This selective approach focuses computational resources on high-risk areas where side channel attacks are most likely to succeed, achieving sufficient detection accuracy without the excessive resource consumption of complete exhaustive analysis.
3Reliability
If side channel attacks are detected after IC fabrication, then detection reliability is improved, but the ability to prevent attacks is reduced
Solution Approach 1:
The patent applies preliminary action by performing side channel correlation analysis during the design phase before IC fabrication. This allows detection of potential side channel vulnerabilities while the design is still modifiable, enabling designers to implement countermeasures such as masking or balancing techniques directly in the design. The ability to prevent attacks is maintained because the analysis occurs before manufacturing locks in the design, resolving the contradiction between detection reliability and redesign capability.
Data Source
AI summary
Methods, machine readable media and systems for simulating the leakage of sensitive data in an integrated circuit, such as cryptographic data or keys, are described. In one embodiment, a method can include the following operations: performing a first dynamic voltage drop (DVD) simulation on a plurality of locations, distributed across an integrated circuit (IC), based on a physical model that specifies physical layout of components on the IC, the IC storing sensitive data in locations of the layout; performing an IC level side channel correlation analysis between each of the locations and the sensitive data based on the results of the first DVD simulation; and selecting, based upon the IC level side channel correlation analysis, a subset of the locations for further simulations to simulate leakage of the sensitive data. Other methods, media and systems are disclosed.