Liquid Crystal Panel Testing Terminals for Driver IC Waste Reduction
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Solution Overview
Problem
Liquid crystal display devices face challenges in testing at multiple stages during manufacturing, leading to waste of driver ICs and polarizing plates due to inadequate testing before mounting, especially for small to medium-sized displays and head-mounted applications where minute bright spots affect display quality.
Innovation Solution
A liquid crystal panel design with integrated testing terminals and circuits on the active matrix substrate allows for multi-stage testing, including performance and lighting tests, before and after polarizing plate application, enabling detection of defects and reducing component waste.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of substance
If performance test is conducted before driver IC mounting, then driver IC waste is reduced, but testing capability is insufficient for detecting minute defects
Solution Approach 1:
The testing process is divided into multiple stages: initial performance testing before driver IC mounting, intermediate lighting testing after polarizing plate application, and final testing after driver IC mounting. This segmentation allows each stage to focus on specific defect types, with later stages detecting minute defects that earlier stages cannot detect, thereby reducing overall component waste while improving detection capability.
Solution Approach 2:
Testing terminals and testing circuits are integrated into the active matrix substrate in advance during manufacturing. The testing capability is prepared beforehand, allowing performance tests to be conducted before driver IC mounting. This preliminary preparation enables early detection of major defects while the substrate structure is still simple and easy to test.
2Reliability
If multiple testing stages are implemented, then defect detection is improved, but device complexity increases
Solution Approach 1:
The testing terminals, testing circuits, gate driver circuit, and demultiplexer circuit are all integrated into a single active matrix substrate. This merging of testing functionality with the display substrate eliminates the need for separate testing equipment and simplifies the overall system architecture, reducing device complexity while enabling multiple testing stages.
Solution Approach 2:
The active matrix substrate serves multiple functions: it acts as the display substrate, contains the testing terminals for various test stages, houses the testing circuits for performance and lighting tests, and integrates the gate driver circuit. This multi-functionality reduces the need for separate dedicated testing devices, thereby reducing overall system complexity.
3Measurement precision
If testing is performed after polarizing plate application, then minute bright spots are detected, but manufacturing time is extended
Solution Approach 1:
The active matrix substrate is prepared with integrated testing terminals and testing circuits during the substrate manufacturing process. This preliminary preparation allows performance testing to be conducted immediately after substrate fabrication but before polarizing plate application. By completing major defect detection at this early stage, the subsequent lighting test after polarizing plate application can focus only on minute defects, reducing the overall time extension.
Data Source
AI summary
A liquid crystal panel includes an active matrix substrate including a gate driver circuit, a demultiplexer circuit, and a gate switch circuit. The active matrix substrate includes a non-display region and a testing terminal region located outside the non-display region, has first and second in-panel testing terminals in the non-display region, and has first and second out-panel testing terminals in the testing terminal region. The second out-panel testing terminal is connected to the gate driver circuit. The first out-panel testing terminal is connected to the demultiplexer circuit. The second in-panel testing terminal is connected to the gate switch circuit. The first in-panel testing terminal is connected to the demultiplexer circuit.