LCD Common Line Repair Pattern for Short Circuit Isolation
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Solution Overview
Problem
LCD devices face defects such as dot and line defects, and short circuits between data and common lines, which can lead to entire pixel region damage, especially with the recent structure where common lines are formed in the same layer as gate lines, causing light leakage and rendering connected thin film transistors non-functional.
Innovation Solution
Incorporating a repair pattern with a third common line formed between first and second common lines, which is wider and exposed on both sides of the data line, allowing for isolation of damaged pixel regions by cutting off the third common line using a laser beam during the repairing process, thus preventing entire pixel region damage from short circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of moving object
If common lines are formed in the same layer as gate lines to improve aperture ratio, then light leakage domains are shielded and aperture ratio is improved, but short circuit between data and common lines occurs causing entire pixel region damage
Solution Approach 1:
The common line is segmented into multiple sections (first common line, second common line, and third common line) with the third section serving as a repair pattern. This segmentation allows the common line to be divided into functional segments, where the third segment can be selectively removed via laser beam to isolate damaged regions without affecting the entire pixel region.
Solution Approach 2:
The third common line acts as an intermediary repair pattern that can be selectively removed using a laser beam. This intermediary structure provides a controlled way to isolate damaged pixel regions by cutting off the short circuit path between data and common lines, thereby preventing entire pixel region damage while maintaining the shielded aperture ratio structure.
2Productivity
If repair pattern is incorporated to isolate damaged regions, then entire pixel region damage is prevented and productivity is improved, but device structure complexity increases
Solution Approach 1:
The third common line is formed in advance during the manufacturing process as a built-in repair pattern. This preliminary action allows for easy repair of short circuits by simply removing the third common line section using a laser beam, without requiring complex repair procedures or additional manufacturing steps, thereby improving productivity.
Solution Approach 2:
The repair process replaces complex mechanical repair operations with a simple laser beam removal process. Instead of requiring physical manipulation or complex repair equipment, the third common line can be selectively removed using laser energy, simplifying the repair mechanism and improving production efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The repair pattern effectively isolates damaged pixel regions, preventing them from affecting adjacent pixels and maintaining the functionality of the LCD device, thereby improving production rates and reducing defects.
Implementation Method 1
irradiating a laser beam at the stacked gate insulation and passivation films opposite to both ends of the third common line to cut off the third common line from the first and second common lines
Data Source
AI summary
An LCD device is disclosed. The LCD device includes: a gate line and a gate electrode formed on a substrate; a common line formed in the same layer as the gate line; a gate insulation film entirely formed on the substrate with the gate line; a data line formed on the gate insulation film opposite to the common line and configured to cross with the gate line and to define a pixel region; a source electrode formed to protrude from the data line; a drain electrode separated by a first distance from the source electrode; a passivation film entirely formed on the substrate with the data line; and a pixel electrode formed on the passivation film and connected to the drain electrode. The common line includes first and second common lines separated by a second distance from each other, and a third common line formed within the second distance between the first and second common lines and used as a repair pattern during a repairing process.