LCD Data Line Repair via Connecting Electrode and Cutting Line
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Solution Overview
Problem
Liquid crystal display devices face significant yield deterioration due to open defects in data lines, which are easily detectable and require costly rework, leading to fabrication inefficiencies.
Innovation Solution
A method involving the formation of a connecting electrode to bridge separated data lines using welding points, accompanied by a cutting line that separates the pixel electrode to prevent short circuits and ensure functionality, allowing for the repair of open defects in data lines within the liquid crystal display device.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If an open defect in a data line is detected during inspection, then the liquid crystal panel is classified as defective, but this results in deterioration of fabrication yield
Solution Approach 1:
The patent applies preliminary action by forming a connecting electrode and cutting line structure in advance during the thin-film transistor array process, before final inspection. This pre-configured repair structure allows open defects to be corrected without discarding the entire panel, thereby maintaining high fabrication yield while ensuring reliable defect detection and correction capability.
2Reliability
If a connecting electrode is formed to bridge separated data lines, then open defects are repaired, but device complexity increases
Solution Approach 1:
The patent applies segmentation by dividing the pixel electrode into multiple regions using a cutting line. This segmentation allows the connecting electrode to be positioned in a dedicated opened region without interfering with the functional areas of the pixel electrode, thereby repairing data line connectivity while maintaining clear functional separation and avoiding excessive complexity.
Solution Approach 2:
The patent resolves complexity by transitioning to another dimension - creating an opened region in the first common electrode layer to accommodate the connecting electrode. This vertical layering approach allows the connecting electrode to bridge separated data lines without adding horizontal complexity to the pixel electrode structure, maintaining organizational simplicity while achieving repair functionality.
3Reliability
If the pixel electrode is cut to prevent short circuits, then functionality is ensured, but manufacturing precision requirements increase
Solution Approach 1:
The cutting line structure is formed as a preliminary feature during the thin-film transistor array process, before final assembly and inspection. This pre-formed cutting line in the pixel electrode creates a natural separation that guides subsequent connecting electrode formation, reducing the precision requirements for later steps while ensuring short circuit prevention through the predetermined separation path.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively reconnects separated data lines, enhances yield and productivity by preventing short circuits, and ensures the repair process does not introduce additional defects, such as pixel defects, thereby improving the overall fabrication efficiency of liquid crystal display devices.
Implementation Method 1
a connecting electrode overlapped with both separated portions of an open data line and the pixel electrode adjacent to the open data line, the connecting electrode being connected with both the separated portions of the open data line by use of welding points
Data Source
AI summary
A liquid crystal display device and a method for fabricating the same are disclosed. The liquid crystal display device includes a plurality of gate lines and data lines defining pixel regions on a substrate, thin-film transistors formed at intersections of the gate lines and the data lines, pixel electrodes formed at the respective pixel regions and connected with the thin-film transistors, a first common electrode and a second common electrode overlapped with both side portions of each pixel electrode to extend parallel to the data lines, an opened region of the first common electrode to divide the first common electrode into two parts in each pixel region, a connecting electrode overlapped with both separated portions of an open data line and the pixel electrode adjacent to the open data line, the connecting electrode being connected with both the separated portions of the open data line by use of welding points, and a cutting line to divide the pixel electrode into a first portion connected with the connecting electrode and a second portion connected with an associated one of the thin-film transistors, the cutting line passing through the opened region of the first common electrode.