LCD Data Transistors for Connection Line Disconnection Detection
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Solution Overview
Problem
Existing liquid crystal display (LCD) devices face challenges in detecting malfunctions of connection lines, particularly due to the downsizing of data integrated circuits, which makes it difficult to identify disconnections between data pads and data lines during the inspection process.
Innovation Solution
The implementation of a liquid crystal display device with first and second data transistors, where the first data transistors are configured to overlap with the data integrated circuit for detecting connection line disconnections and the second data transistors, positioned outside the integrated circuit, are used to detect malfunctions of liquid crystal cells and connection lines, with distinct inspection signals and control lines for each during separate inspection periods.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If data transistors are formed at the data integrated circuits to enable inspection, then the inspection capability is improved, but the area available for transistor formation decreases due to downsizing of data integrated circuits
Solution Approach 1:
The patent utilizes the overlapping area between the data integrated circuit and the liquid crystal panel as a third spatial dimension for transistor formation. By forming first data transistors in the overlapping region and second data transistors in the non-overlapping region, the invention effectively expands the available area for transistor formation without increasing the overall device footprint.
Solution Approach 2:
The patent divides the data transistor population into two distinct groups: first data transistors formed in the overlapping area with the data integrated circuit, and second data transistors formed in the non-overlapping area. This segmentation allows each group to serve specific inspection functions while optimizing area utilization.
2Ease of operation
If data transistors are directly connected to data lines for inspection, then the inspection process is simplified, but the ability to detect connection line malfunctions is lost
Solution Approach 1:
The patent introduces data pads as intermediary elements between the data lines and the data transistors. The first data transistors are connected to data pads, which in turn are connected to data lines through connection lines. This intermediary structure enables the inspection system to detect malfunctions in the connection lines themselves, not just in the liquid crystal cells.
Solution Approach 2:
The patent adds an additional inspection dimension by creating two separate transistor groups with different connection paths. The first data transistors provide a direct inspection path for connection lines, while the second data transistors provide an alternative path for inspecting liquid crystal cells, thereby enabling comprehensive multi-dimensional inspection.
Data Source
AI summary
The embodiment is to provide a liquid crystal display device capable of detecting malfunctions. The liquid crystal display device includes pixels configured to be connected to scan lines and data lines, data pads electrically connected to the data lines, a data integrated circuit supplying data signals to the data lines through the data pads, first data transistors coupled to the data pads, and second data transistors coupled to the data lines. The first data transistors are disposed on the data integrated circuit and the second data transistors are separated from the data integrated circuit.