LCD Pad Segmentation for Flexible Testing

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Solution Overview

Problem

Existing liquid crystal display (LCD) testing methods face challenges such as signal delay and false line defect detection due to pin contact failures, and lack flexibility in testing individual pixels or small groups of pixels.

Innovation Solution

The solution involves forming gate and data pads with sub-groups of shorting bars that are independently connected, allowing for the application of test signals to odd and even sub-groups, reducing pin-contact failures and enabling more flexible testing by applying signals to specific sub-groups of pads.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If needle pins contact all data pads and gate pads for testing, then the test can be performed by applying test signals in the same manner as real signals, but false line defect detection occurs due to pin contact failure

Engineering Contradiction:
Improvetest accuracyVSAvoidfalse defect detection
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The gate pads and data pads are divided into multiple groups (first through fourth groups), with each group connected to a separate shorting bar. This segmentation allows selective testing of different pad groups using fewer needle pins, reducing contact failures while maintaining comprehensive test coverage through systematic group-by-group testing.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If a jig of needle pins contacts all data pads and gate pads, then complete coverage testing is achieved, but the jig must be manufactured for each model of LC panel

Engineering Contradiction:
Improvetest coverageVSAvoidjig manufacturing complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The shorting bar structure provides universal functionality across different LC panel models. By connecting multiple pads within each group to a single shorting bar, the same testing apparatus can be used for various panel sizes and configurations, eliminating the need to manufacture custom jigs for each model while maintaining complete test coverage.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Ease of operation

If all even and odd gate pads and data pads are combined using shorting bars, then the number of contacts is reduced, but signal delay occurs during testing

Engineering Contradiction:
Improvenumber of contactsVSAvoidsignal delay
Core Design Contradiction:
Ease of operationVSLoss of time

Solution Approach 1:

The pad groups are segmented and tested sequentially rather than simultaneously. This allows the testing process to progress through different groups in a controlled manner, managing signal timing and reducing delays while maintaining the reduced contact advantage of the shorting bar approach.

Inventive Principle:
Principle #1Segmentation

4Measurement precision

If needle pins contact each pad individually, then precise individual pad testing is possible, but two or more operators are required

Engineering Contradiction:
Improveindividual pad test precisionVSAvoidnumber of operators
Core Design Contradiction:
Measurement precisionVSExtent of automation

Solution Approach 1:

By grouping pads and connecting them to shorting bars, the testing process can be automated with a single operator controlling the sequential testing of each group. The segmentation into manageable groups maintains the precision of individual pad testing while reducing the need for multiple operators to handle individual pin contacts.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS8054440B2Liquid crystal display, manufacturing method thereof, and method for testing liquid crystal display
Publication Date: 2011.11.08 LG DISPLAY CO LTD
  • US8054440B2 patent drawing
  • US8054440B2 patent drawing
  • US8054440B2 patent drawing

AI summary

A liquid crystal display device includes gate pads on a first side of an insulating substrate, gate pad parts, which contain a sub-group of the gate pads, a plurality of gate shorting bars within the gate pad parts, data pads on a second side of the insulating substrate, data pad parts, which contain a sub-group of the data pads, and a plurality of data shorting bars within the gate pad parts.