Pixel Inspection via Independent Voltage Ranges in LCD

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing liquid crystal display devices using subframe driving methods face challenges in accurately inspecting pixels due to narrow setting ranges of intermediate voltages and performance variations across different foundries, leading to potential inaccuracies in pixel inspection.

Innovation Solution

A liquid crystal display device configuration with a conductive switch between pixels, allowing for separate voltage settings for NMOS and PMOS transistors in each pixel, and a pixel inspection method that involves setting the source voltage range of these transistors differently between adjacent pixels to facilitate accurate data transfer and inspection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the setting range of intermediate voltage is narrow in existing liquid crystal display devices, then the device structure remains simple, but pixel inspection accuracy deteriorates due to process variations and foundry performance differences

Engineering Contradiction:
Improvepixel inspection accuracyVSAvoidvoltage setting complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies local quality by enabling independent voltage range settings for different pixel groups. Specifically, first pixels have their source voltage ranges for NMOS and PMOS transistors set separately from second pixels, allowing optimized inspection conditions for each group while maintaining overall system functionality.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent segments the pixel array into multiple groups (first pixels and second pixels) with independently controllable voltage settings. This segmentation allows different voltage ranges to be applied to different pixel groups, improving inspection accuracy across process variations without requiring a completely complex centralized control system.

Inventive Principle:
Principle #1Segmentation

2Reliability

If separate voltage settings are implemented for NMOS and PMOS transistors in adjacent pixels, then inspection reliability improves, but device complexity increases

Engineering Contradiction:
Improveinspection reliabilityVSAvoidvoltage control complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent implements local quality by providing independent source voltage control for NMOS and PMOS transistors in different pixel groups. First pixels have their transistor source voltages set within a first range, while second pixels have their transistor source voltages set within a second range, allowing optimized inspection conditions locally for each pixel group.

Inventive Principle:
Principle #3Local quality

3Measurement precision

If the resistance of switches during inspection is reduced through enhanced drive capability, then data transfer accuracy improves, but power consumption increases

Engineering Contradiction:
Improvedata transfer accuracyVSAvoidpower consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent applies dynamics by implementing time-varying voltage settings. During inspection periods, source voltages are adjusted to optimized ranges to reduce switch resistance and improve data transfer accuracy. During normal display operations, the voltage settings return to standard operating ranges, avoiding continuous high power consumption while maintaining inspection accuracy when needed.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS10013931B2Liquid crystal display device and pixel inspection method therefor
Publication Date: 2018.07.03 JVC KENWOOD CORP
  • US10013931B2 patent drawing
  • US10013931B2 patent drawing
  • US10013931B2 patent drawing

AI summary

According to one embodiment, each pixel of a liquid crystal display device includes: a switch configured to sample subframe data; a storage unit configured to hold the subframe data sampled by the switch, the storage unit and the switch constituting an SRAM cell; and a conductive switch disposed between a liquid crystal display element and an adjacent pixel. A range of a source voltage of NMOS and PMOS transistors constituting each inverter constituting the storage unit of one pixel is configured to be able to be set separately from a range of a source voltage of NMOS and PMOS transistors constituting each inverter constituting the storage unit of another pixel.