LCD Pixel Auto Probe Test Pattern Using Data Shorting Bars
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Solution Overview
Problem
The existing auto probe test methods for LCD devices with a pixel structure of two data/one gate, where pixels adjacent to each other vertically share a gate line, are not compatible with the traditional test patterns, preventing effective testing of these pixel structures.
Innovation Solution
A test pattern and method that include data shorting bars and switching units to supply test signals to pixels, dividing them into groups connected to even or odd gate lines, allowing for accurate testing of pixels by sharing a gate line while receiving data voltages from different data lines, ensuring proper formation and functionality of gate and data lines.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If traditional test patterns are used for LCD devices, then testing of conventional pixel structures is achieved, but testing of two data/one gate pixel structures is not compatible
Solution Approach 1:
The test pattern is segmented into multiple data shorting bars (first, second, third, and fourth data shorting bars) that selectively short different data lines. This segmentation allows independent control of test signals for pixels connected to different gate lines, enabling compatibility with two data/one gate pixel structures while maintaining testing accuracy through targeted signal application.
2Device complexity
If pixels share a gate line to reduce gate line count, then manufacturing complexity is reduced, but traditional test methods cannot effectively test all pixels
Solution Approach 1:
Data shorting bars serve as intermediary elements between test signal sources and pixels. These shorting bars selectively connect different data lines to test signal inputs, acting as mediators that enable effective testing of pixels sharing common gate lines. The switching units further mediate by controlling signal distribution to ensure all pixels connected to shared gate lines can be individually tested.
3Measurement precision
If multiple data shorting bars are used to test different pixel groups, then testing coverage is improved, but test pattern complexity increases
Solution Approach 1:
The data shorting bars and switching units are designed with multi-functionality to reduce overall test pattern complexity. The same data shorting bars and switching units can be reused across different test configurations and pixel groups, eliminating the need for entirely separate test structures for each pixel group. This universal design achieves comprehensive testing coverage while minimizing the total number of test components required.
Data Source
AI summary
A liquid crystal display (LCD) device and a method for testing pixels of the LCD device are disclosed, in which pixels adjacent to each other vertically are arranged in a display area to share a gate line and an auto probe test pattern of the pixels is arranged in a non-display area. The LCD device comprises a plurality of pixels arranged in a display area; and a test pattern arranged in a non-display area, for supplying a test signal to each of the plurality of pixels, wherein two pixels, which are adjacent to each other vertically, among the plurality of pixels, share a single gate line and receive data voltages from different data lines different from each other, and the test pattern includes at least one data shorting bar and at least one switching unit to supply the test signal to each of the plurality of pixels per color.