LCD Array Substrate Repair Line and Test Line Integration
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Solution Overview
Problem
Conventional liquid crystal display (LCD) array substrates face defects such as breakage in data lines, leading to line defects that prevent signal transmission to affected areas, resulting in operational issues.
Innovation Solution
The introduction of a repair line structure outside the display region, which includes a test line and a repair line that are electrically isolated until repair is necessary, allowing for the connection and utilization of the test line as part of the repair path to restore signal transmission through the array substrate, thereby reducing the non-display area and minimizing signal delay.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a separate test line and repair line are provided outside the display region, then the array substrate can be tested and repaired, but the non-display area increases
Solution Approach 1:
The patent merges the test line and repair line into a single integrated structure. The test line is configured to be electrically isolated from the repair line during normal operation, but can be electrically connected to the repair line when repair is needed. This integration allows both testing and repair functions to share the same physical space, reducing the non-display area while maintaining full functionality.
Solution Approach 2:
The integrated line structure serves multiple functions: it acts as a test line during normal testing operations and transforms into a repair line when defects are detected. The test line can be electrically connected to the repair line to form a complete repair path, allowing the same physical infrastructure to support both quality assurance and defect remediation without requiring separate dedicated structures.
2Ease of repair
If the test line is electrically connected to the repair line, then repair can be performed, but normal test operation may be affected
Solution Approach 1:
The electrical connection state between the test line and repair line is dynamic rather than fixed. During normal test operations, the test line and repair line are electrically isolated to ensure clean testing without interference from the repair line. When repair is needed, the connection state changes dynamically to electrically connect the test line with the repair line, enabling repair functionality while maintaining test integrity during normal operations.
Data Source
AI summary
An array substrate of a liquid crystal display includes data lines; scanning lines configured to cross with the data lines; a test line provided outside a display region of the array substrate for test of the array substrate; and a repair line provided outside the display region for repair of a defective data line. The test line is configured to be electrically isolated from the repair line when the repair is not carried out and is electrically connected to the repair line and the defective data line when the repair is performed. A method of repairing the array substrate and a liquid crystal display using the array substrate are also provided. According to the invention, the test line can be used as a part of a repair circuit for repair of the data lines, thereby greatly decreasing non-display area.