LCD Signal Measurement Circuit for Non-Destructive Waveform Testing

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Solution Overview

Problem

Current methods for measuring voltage signals in liquid crystal display (LCD) devices require glass splintering, leading to product damage, waste, and potential health hazards from inhaled liquid crystals.

Innovation Solution

A signal measurement circuit comprising switches and resistors, with specific configurations of N-type and P-type field-effect transistors, allows for non-invasive measurement of waveform signals on scan and data lines using a shim, enabling quick signal measurement without damaging the product.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If glass splintering is performed to measure voltage signals, then measurement can be performed, but product is damaged and liquid crystals volatilize causing health hazards

Engineering Contradiction:
Improvevoltage signal measurementVSAvoidliquid crystal volatilization and health hazards
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent introduces a measurement circuit as an intermediary system that includes switching elements (first switch connected to second node, second switch connected to fourth node), resistors (first resistor, second resistor), and a measurement terminal. This intermediary circuit allows voltage signals on data lines and scan lines to be measured without direct access to the glass edge, thereby preventing glass splintering and liquid crystal volatilization while achieving accurate measurement

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If glass splintering is performed to measure voltage signals, then measurement can be performed, but measurement time is relatively long

Engineering Contradiction:
Improvevoltage signal measurementVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The measurement circuit is pre-integrated into the display device structure during manufacturing, with switching elements and resistors positioned to access data lines and scan lines before any potential damage occurs. This preliminary setup eliminates the need for time-consuming glass splintering operations during actual measurement, enabling immediate voltage signal measurement

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If glass splintering is performed to measure voltage signals, then measurement can be performed, but product is damaged causing wastes

Engineering Contradiction:
Improvevoltage signal measurementVSAvoidproduct damage and waste
Core Design Contradiction:
Measurement precisionVSLoss of substance

Solution Approach 1:

The measurement circuit serves as a protective intermediary that enables measurement functionality without requiring destructive access to the glass edge. The switching elements and resistors are configured to tap voltage signals from data lines and scan lines through non-invasive electrical connections, preserving the integrity of the glass substrate and preventing product damage and waste

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables rapid and safe measurement of signal waveforms without affecting product performance or causing additional device costs, eliminating the need for glass splintering and associated health risks.

Implementation Method 1

A signal measurement circuit comprising switches and resistors, with specific configurations of N-type and P-type field-effect transistors

Methodology Applied
Scientific EffectField-effect transistor operation:

Data Source

PatentUS10977972B2Signal measurement circuit and measurement method therefor
Publication Date: 2021.04.13 HKC CORP LTD
  • US10977972B2 patent drawing
  • US10977972B2 patent drawing
  • US10977972B2 patent drawing

AI summary

This application provides a signal measurement circuit and a measurement method therefor. The signal measurement circuit is separately connected to a scan line and a data line by using a shim, to measure waveform signals of the scan line and the data line.