LCD Test Circuit Narrow Bezel Design
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Solution Overview
Problem
The existing arrangement of test circuits and source driving circuits within the outer lead bonding area of liquid crystal displays (LCDs) hinders the design of narrow bezel LCDs, as it occupies valuable space and complicates the manufacturing process.
Innovation Solution
A test circuit comprising signal pads, a first data distributor, logic circuit units, and switches is positioned within a dedicated area, allowing selective distribution and control of test signals to data lines, enabling efficient testing without conflicting with the source driving circuit's operations and allowing for a narrower bezel design by eliminating the need for wire routing between areas.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If the test circuit and source driving circuit are positioned within the outer lead bonding area, then the manufacturing process is simplified, but the bezel width increases and narrow bezel design is hindered
Solution Approach 1:
The invention divides the substrate area into distinct functional zones: the pixel array area for display functions and a separate test circuit area for testing operations. This spatial segmentation allows the test circuit to be positioned independently from the source driving circuit, enabling narrow bezel design while maintaining simplified manufacturing processes through dedicated area allocation.
2Ease of manufacture
If the test circuit is positioned within the outer lead bonding area, then wire routing is simplified, but the layout area increases and narrow bezel design is compromised
Solution Approach 1:
The test circuit is extracted from the outer lead bonding area and positioned in a dedicated test circuit area. This extraction eliminates the need for wire routing between the test circuit and source driving circuit, as both can be positioned adjacently within the pixel array area, thereby reducing the overall layout area while maintaining manufacturing simplicity.
3Reliability
If the test circuit operates independently from the source driving circuit, then pixel array operation is ensured, but the device complexity increases
Solution Approach 1:
The invention implements local quality by providing dedicated test signal lines that are separate from the data lines used during normal display operation. This allows the test circuit to operate independently without interfering with the source driving circuit's functionality, ensuring pixel array operation reliability while managing complexity through localized signal paths.
Data Source
AI summary
A liquid crystal display and a test circuit thereof are provided. The test circuit has a plurality of signal pads, a first data distributor, a plurality of logic circuit units and N switches. N is a positive integer. The signal pads are configured to receive a test data signal, a voltage signal, an enable signal and a plurality of first switch control signals. The first data distributor distributes the test data signal to N output terminals of the first data distributor. Each of the logic circuit units generates a second switch control signal according to the voltage signal, the enable signal and a corresponding one of the first switch control signals. Each of the switches controls the electrical connection between an output terminal of the first data distributor coupled thereto and at least a data line coupled thereto.