LCOS Aberration Correction and Pattern Illumination
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing observation apparatuses using phase-modulating spatial light modulators (LCOS-SLM) cannot perform LSM observation while correcting aberrations and creating desired illumination patterns simultaneously, as the illumination light paths for LCOS and two-dimensional scanners are distinct.
Innovation Solution
An observation apparatus with a spatial-light-modulating element, scanning portion, focusing portion, and control portion that modulates the wavefront of illumination light to correct aberrations and form desired patterns on a specimen, allowing for simultaneous LSM observation and pattern illumination using a single LCOS, with optional zero-order-light removal and optical-path splitting for enhanced functionality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If separate illumination light paths are used for LCOS and two-dimensional scanner, then pattern illumination with LCOS and LSM observation with scanner can be performed simultaneously, but aberration correction cannot be achieved during LSM observation
Solution Approach 1:
The patent merges the illumination light path for LCOS and the illumination light path for two-dimensional scanner into a single common light path. This allows a single LCOS to perform both pattern illumination and aberration correction functions, eliminating the need for separate optical paths and enabling simultaneous LSM observation with aberration correction.
Solution Approach 2:
The single LCOS is designed to perform multiple functions: it can modulate the wavefront for pattern illumination and also correct aberrations during LSM observation. This multi-functional design allows the system to achieve both pattern illumination capability and aberration correction precision using one spatial-light-modulating element.
2Manufacturing precision
If a single LCOS is used for both pattern illumination and aberration correction, then aberration correction during LSM observation is enabled, but the system complexity increases due to coordination requirements
Solution Approach 1:
The system dynamically switches the function of the single LCOS based on operational mode. During pattern illumination, the LCOS creates desired light patterns; during LSM observation, it corrects aberrations. The control portion dynamically adjusts the LCOS operation to match the current operational requirement, managing system complexity through adaptive control.
Solution Approach 2:
The control portion coordinates the single LCOS operation based on feedback from the operational mode (illumination or observation). This feedback mechanism allows the system to automatically adjust the LCOS function without requiring complex manual coordination, reducing overall system complexity while maintaining precision.
3Productivity
If the spatial-light-modulating element is controlled to form desired illumination patterns, then multiple irradiation positions can be simultaneously stimulated, but switching speed between observation modes is reduced
Solution Approach 1:
The system prepares the LCOS in advance for the next operational mode. When switching from pattern illumination to LSM observation, the LCOS is pre-configured to switch from pattern formation to aberration correction mode, reducing the switching time. This preliminary preparation enables faster mode transitions while maintaining the ability to stimulate multiple positions simultaneously during illumination mode.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise LSM observation and pattern illumination on multiple specimen positions while correcting aberrations, with improved switching speed between observation modes and reduced unwanted light stimulation, using a single LCOS and without requiring coordination between the spatial-light-modulating element and scanner.
Implementation Method 1
a spatial-light-modulating element that is disposed at a position optically conjugate with a pupil position of the objective lens and is capable of modulating the wavefront of the illumination light to be radiated onto the specimen by the objective lens
Implementation Method 2
the spatial-light-modulating element corrects aberrations at the focal position
Implementation Method 3
a scanning portion that is disposed at a position optically conjugate with the spatial-light-modulating element and is capable of two-dimensionally scanning the illumination light to be radiated onto the specimen by the objective lens
Implementation Method 4
an objective lens that focuses illumination light emitted from a light source and radiates the illumination light onto a specimen
Implementation Method 5
a focusing portion that adjusts the focal position, in the specimen, of the objective lens in the optical axis direction
Data Source
AI summary
An object is to enable LSM observation while correcting aberrations, as well as illumination with a desired pattern, using a single LCOS. An observation apparatus of the present invention includes an objective lens that focuses laser light emitted from a light source and radiates the laser light onto a specimen; an LCOS disposed at a position optically conjugate with the pupil position of the objective lens and capable of modulating, according to a wavefront modulation pattern, the wavefront of the laser light to be radiated onto the specimen by the objective lens; a scanner disposed at a position optically conjugate with the LCOS and capable of two-dimensionally scanning the laser light to be radiated onto the specimen by the objective lens; a focusing mechanism that adjusts the focal position, in the specimen, of the objective lens in the optical axis direction; and a control unit that controls the LCOS such that the LCOS corrects aberrations at the focal position adjusted by the focusing mechanism and forms a desired illumination pattern on the specimen.


