Liquid Crystal Panel Recess Alignment Control

The patent transitions from controlling alignment through protrusive structure height (vertical dimension) to controlling through recess depth (also vertical but opposite direction). This dimensional approach allows the protrusive structure height to remain constant while achieving enhanced alignment control through the recess configuration, thereby resolving the contradiction between manufacturing precision and ease of manufacture.

The patent changes the controlling parameter from protrusive structure height to recess depth. By maintaining the protrusive structure size and height constant while varying the recess depth, the alignment control effect is enhanced without increasing manufacturing difficulty, as the recess can be formed through standard photolithography and etching processes.

The patent shifts the alignment control mechanism from increasing protrusive structure height to configuring recess depth. This allows alignment efficiency to be improved through recess geometry (depth, width, shape) rather than protrusive structure dimensions, thereby avoiding increased manufacturing complexity while achieving the desired alignment control.

The patent applies local quality by creating a recess with specific depth and width around the protrusive structure. The recess provides localized alignment control in the region where liquid crystal molecules contact the substrate, enhancing alignment efficiency without requiring changes to the overall protrusive structure dimensions or increasing manufacturing complexity.