LDMOS Transistor Body Tie Merging for Reduced On-Resistance

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Solution Overview

Problem

Conventional LDMOS transistors have an increased footprint due to the body tie region, which also raises the on-resistance and area product, posing a challenge in reducing the parasitic bipolar transistor's activation and potentially damaging the transistor.

Innovation Solution

The solution involves situating body tie regions adjacent to the gate and source regions, reducing the distance between them, and using a silicide layer to electrically connect body tie and source regions, thereby reducing parasitic resistance and area while maintaining control over the parasitic bipolar transistor.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a body tie region is situated close to the source region to reduce resistance, then the on-resistance is reduced, but the area or footprint of the MOS transistor increases

Engineering Contradiction:
Improveon-resistanceVSAvoidfootprint
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The body tie region is merged with the source region by forming the body tie region within the source region boundaries. This integration allows the body tie contact to electrically connect the source region to the body region while occupying the same physical space as the source region, thereby reducing resistance without increasing the transistor footprint.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The body tie region is positioned in a vertical dimension within the source region rather than extending horizontally adjacent to it. This dimensional repositioning allows the body tie contact to be formed through the source region to reach the body region, achieving electrical connection without increasing the planar footprint of the device.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If the body tie region is extended to reduce parasitic resistance, then the electrical connection is improved, but the device area increases

Engineering Contradiction:
Improveelectrical connectionVSAvoiddevice area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The body tie region is merged with the source region by forming the body tie region within the source region boundaries. This integration allows the body tie contact to electrically connect the source region to the body region while occupying the same physical space as the source region, thereby reducing resistance without increasing the transistor footprint.

Inventive Principle:
Principle #5Merging (Combining)

3Reliability

If the body tie region is positioned to control the parasitic bipolar transistor, then the transistor protection is improved, but the footprint increases

Engineering Contradiction:
Improvetransistor protectionVSAvoidfootprint
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The body tie region is merged with the source region by forming the body tie region within the source region boundaries. This integration allows the body tie contact to electrically connect the source region to the body region while occupying the same physical space as the source region, thereby reducing resistance without increasing the transistor footprint.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration results in a reduced on-resistance and area product for the MOS transistor, enhancing control over the parasitic bipolar transistor and minimizing the transistor's footprint on the semiconductor die.

Implementation Method 1

using a silicide layer to electrically connect body tie and source regions, thereby reducing parasitic resistance

Methodology Applied
Scientific EffectElectrical Conduction: Conduction (electrical)

Data Source

PatentUS8482065B2MOS transistor with a reduced on-resistance and area product
Publication Date: 2013.07.09 NEWPORT FAB LLC
  • US8482065B2 patent drawing
  • US8482065B2 patent drawing
  • US8482065B2 patent drawing

AI summary

According to an exemplary embodiment, a MOS transistor, such as an LDMOS transistor, includes a gate having a first side situated immediately adjacent to at least one source region and at least one body tie region. The MOS transistor further includes a drain region spaced apart from a second side of the gate. The MOS transistor further includes a body region in contact with the at least one body tie region, where the at least one body tie region is electrically connected to the at least one source region. The MOS transistor further includes a lightly doped region separating the drain region from the second side of the gate. The lightly doped region can isolate the body region from an underlying substrate.