LDPC Parity Bit Puncturing Pattern for Reliable Rate Adaptation

The patent applies parameter changes by systematically varying the puncturing pattern parameters (selecting different bit positions according to predefined patterns) to optimize the balance between adaptability and reliability. Instead of arbitrary bit selection, the invention uses structured parameter-based selection where punctured bit positions are determined by mathematical patterns and code structure characteristics, ensuring that critical bits are preserved while achieving the desired code rate adaptation.

The patent applies local quality by differentiating between important and less important bits within the LDPC code structure. The puncturing pattern is designed to selectively remove bits based on their local characteristics and importance to code performance. By identifying and preserving critical bits (those with higher impact on decoding reliability) while puncturing less critical bits, the invention achieves productivity improvement without significant reliability loss.

The patent applies partial action by implementing selective puncturing rather than complete transmission of all coded bits. The invention determines the optimal number of bits to puncture based on channel conditions and quality requirements, transmitting only the essential portion of the code. This partial transmission approach achieves productivity improvement by reducing overhead while maintaining sufficient reliability through careful selection of which bits to transmit.