On-Chip Leakage Current Sensing via Frequency Output

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Solution Overview

Problem

Existing leakage current detection methods for System on a Chip (SoC) devices are time-consuming and not suitable for in-field testing, affecting power efficiency and requiring more efficient and convenient detection solutions.

Innovation Solution

An on-chip leakage-current detection device comprising a first inverter, a voltage storage device, and additional inverters, which converts leakage current into a frequency signal proportional to the leakage current magnitude, allowing for accurate and efficient measurement and approximation of leakage current on SoCs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If known leakage-current detection methods such as Iddq testing are used, then leakage current can be detected, but the detection process is time consuming and cannot be performed in the field

Engineering Contradiction:
Improveleakage current detection accuracyVSAvoiddetection time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces traditional external testing equipment and procedures with an on-chip integrated circuit that electronically measures leakage current. The test circuit includes voltage sources, measurement circuits, and processing logic all integrated on the chip, eliminating the need for external testing equipment and reducing detection time significantly.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent enables the system to perform self-diagnosis by integrating the leakage current detection functionality directly into the chip. The on-chip test circuit can autonomously measure and report leakage current without requiring external testing equipment or manual intervention, allowing field testing and reducing dependency on external testing infrastructure.

Inventive Principle:
Principle #25Self-service

2Speed

If forward biasing electrical components on the SoC is used to enhance speed, then the speed of the SoC increases, but the leakage current and power consumption increase

Engineering Contradiction:
ImproveSoC operating speedVSAvoidpower consumption
Core Design Contradiction:
SpeedVSLoss of energy

Solution Approach 1:

The patent implements feedback mechanisms where the measured leakage current information is used to dynamically adjust operating parameters. The system can monitor leakage current in real-time and adjust voltage, frequency, or other operational parameters to optimize the balance between speed and power consumption, preventing excessive power draw while maintaining acceptable performance.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS11313900B2Methods and devices for measuring leakage current
Publication Date: 2022.04.26 STMICROELECTRONICS INT NV
  • US11313900B2 patent drawing
  • US11313900B2 patent drawing
  • US11313900B2 patent drawing

AI summary

An on chip leakage-current detection device including a first inverter where the magnitude of delay of the output signal of the first inverter is determined by a leakage current of a target device. The leakage-current detection device further includes: a capacitor that is charged by the output signal of the first inverter; a second inverter coupled to capacitor that switches states when the capacitor is charged to a switching level; an odd number of additional inverters coupled in a sequence with a second-inverter output. The output of the leakage-current detection device has a frequency proportional to the leakage of the target device.