Leakage Detection Circuit for Nonvolatile Storage Pin Reliability
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Storage devices with nonvolatile memory face challenges in detecting and operating effectively with defective GPIO pins, leading to performance issues due to potential leakage, which existing technologies fail to address adequately.
Innovation Solution
A storage device with a leakage detection circuit that merges signals from multiple pins with the same attribute, determines leakage occurrence, and adjusts the operation mode of nonvolatile memory devices based on the detection, allowing the system to function without being affected by defective pins.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If GPIO pins are used for general-purpose input/output operations, then the storage device can perform multiple functions, but leakage may occur at defective pins causing reliability issues
Solution Approach 1:
The leakage detection circuit performs preliminary detection of leakage at GPIO pins before normal operation. The controller detects leakage states in advance and prepares alternative operation modes, preventing defective pins from causing reliability issues during actual storage operations.
Solution Approach 2:
The storage device dynamically adjusts its operation mode based on detected leakage conditions. When leakage is detected at certain GPIO pins, the controller switches to an alternative operation mode that avoids using the defective pins, maintaining reliability while preserving adaptability for non-defective pins.
2Reliability
If leakage detection is performed at each GPIO pin, then defective pins can be identified, but the device complexity increases
Solution Approach 1:
The leakage detection circuit merges detection signals from multiple GPIO pins and processes them collectively. Instead of implementing separate detection circuits for each pin, the system combines detection functions into a unified circuit that can identify leakage at any GPIO pin through shared detection and control logic.
3Productivity
If the storage device operates with defective GPIO pins, then productivity is maintained, but harmful effects from leakage occur
Solution Approach 1:
The leakage detection circuit converts the harmful leakage effect into useful information by detecting and identifying which pins exhibit leakage. This detection capability allows the controller to adaptively reconfigure operations to avoid defective pins, transforming the potential harm into an opportunity for improved reliability through informed operational adjustments.
Data Source
AI summary
A storage device includes a plurality of nonvolatile memory devices, a storage controller circuit and a leakage detection circuit. The storage controller circuit controls a plurality of nonvolatile memory devices, the storage controller circuit includes a plurality of connection terminals, each of the plurality of connection terminals is commonly connected to a corresponding set of pins, from among the pluralities of pins included in the plurality of nonvolatile memory devices, via a corresponding connection node, from among a plurality of connection nodes. The pins included in each set of pins have a same attribute. The leakage detection circuit is configured to determine whether leakage occurs at each set of pins based on the merged signal generated by the connection node connected to each set of pins, and configured to provide the storage controller circuit with a detection signal indicating a result of the determination.