LED Array Illumination Uniformity Correction in Semiconductor Exposure

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Solution Overview

Problem

Existing semiconductor manufacturing processes face challenges in achieving uniform exposure across the whole surface of a substrate due to the deterioration of LEDs over time, leading to variations in exposure amounts and non-uniform resist patterns.

Innovation Solution

An exposure apparatus with independently controllable light irradiation units and a light receiving unit to detect illuminance distribution, allowing for adjustments in light quantity to ensure uniform exposure across the substrate by moving the stage and light receiving unit along the irradiation area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If LEDs are used for exposing the whole surface of the substrate, then the exposure process can be completed, but the LEDs deteriorate with the lapse of use time causing non-uniform exposure amounts

Engineering Contradiction:
Improveexposure process completionVSAvoidexposure amount uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The illumination system is divided into multiple independent light irradiation units (LEDs) arranged in an array. Each unit can be independently controlled to emit light to different positions on the substrate. This segmentation allows individual adjustment of each LED's light output to compensate for deterioration, maintaining uniform exposure across the entire substrate surface.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different light irradiation units are assigned different light quantities based on their individual characteristics and positions. The control unit adjusts the current supplied to each LED independently, creating a non-uniform current distribution that compensates for LED deterioration and illuminance distribution variations, thereby achieving uniform exposure across the substrate.

Inventive Principle:
Principle #3Local quality

2Ease of operation

If constant current is supplied to LEDs, then the operation is simple, but the exposure amounts become non-uniform due to LED deterioration

Engineering Contradiction:
Improvecurrent supply simplicityVSAvoidexposure amount uniformity
Core Design Contradiction:
Ease of operationVSManufacturing precision

Solution Approach 1:

The system transitions from static constant current supply to dynamic current adjustment. The control unit continuously monitors illuminance distribution and adjusts the current supplied to each LED in real-time based on detected variations and predetermined correction values, maintaining exposure uniformity despite LED deterioration over time.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

A light receiving unit detects the actual illuminance distribution across the substrate. The control unit uses this feedback information to calculate and apply correction values to the current supplied to each LED, creating a closed-loop control system that maintains uniform exposure amounts despite LED deterioration.

Inventive Principle:
Principle #23Feedback

3Ease of manufacture

If the whole surface of the substrate is exposed using a fixed LED array, then the process is straightforward, but CD uniformity deteriorates due to illuminance distribution variations

Engineering Contradiction:
Improveexposure process simplicityVSAvoidcritical dimension uniformity
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

Different regions of the substrate receive different light quantities from corresponding light irradiation units. The system applies local correction factors to each LED's output based on the specific illuminance characteristics of that region, ensuring uniform exposure and consistent critical dimensions across the entire substrate surface.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The system changes the operational parameters (current values) of individual LEDs based on predetermined correction values that account for illuminance distribution variations. By adjusting these parameters dynamically, the system compensates for non-uniform illuminance and maintains consistent exposure amounts and critical dimensions across the substrate.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Prevents deviations in exposure amounts and ensures uniformity of the resist pattern by detecting and correcting illuminance distribution, thereby maintaining consistent critical dimension (CD) across the substrate.

Implementation Method 1

a light receiving unit configured move in the irradiation area between one end and the other end of the irradiation area in order to detect an illuminance distribution of the irradiation area in a longitudinal direction of the irradiation area

Methodology Applied
Scientific EffectLight detection: Photoelectric Effect

Data Source

PatentUS10558125B2Exposure apparatus, exposure apparatus adjustment method and storage medium
Publication Date: 2020.02.11 TOKYO ELECTRON LTD
  • US10558125B2 patent drawing
  • US10558125B2 patent drawing
  • US10558125B2 patent drawing

AI summary

An exposure apparatus includes a stage on which a substrate is placed, a plurality of light irradiation units configured to emit light independently of each other to different positions in a right and left direction on a surface of the substrate, so as to form a strip-like irradiation area extending from one end of the surface of the substrate to the other end of the substrate, a stage moving mechanism configured to move the stage in a back and forth direction relative to the irradiation area, such that the whole surface of the substrate is exposed, and a light receiving unit configured move in the irradiation area between one end and the other end of the irradiation area in order to detect an illuminance distribution of the irradiation area in a longitudinal direction of the irradiation area.