LED Lamp Bead Chip Dual-Fuse Programming for Reliable Address Rewriting
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Solution Overview
Problem
Traditional LED lamp bead chips with single-fuse programming structures face issues with programming failures, necessitating improvements to ensure successful programming.
Innovation Solution
A dual-fuse structure is introduced with OR gate logic, where two fuses are arranged between each group of logical addresses, and a time-sharing fusing mechanism is employed to rewrite internal logical values using external light containing address information.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single-fuse programming structure is adopted, then the device complexity is reduced, but the programming success rate deteriorates
Solution Approach 1:
The patent applies beforehand cushioning by introducing a dual-fuse structure with backup capability. When the first fuse programming fails, the system can automatically switch to the second fuse for re-programming, providing a pre-established safety net that cushions against programming failures and ensures reliability without significantly increasing structural complexity.
2Reliability
If a dual-fuse structure is adopted, then the programming success rate is improved, but the device complexity increases
Solution Approach 1:
The patent applies segmentation by dividing the programming function into two separate fuse structures, where each fuse can independently perform the programming task. This segmentation allows the system to attempt programming through the first fuse and, upon failure, switch to the second fuse, thereby improving success rate while keeping each individual fuse structure simple and manageable.
3Reliability
If the programming current is increased, then the programming success rate is improved, but the risk of damaging the chip increases
Solution Approach 1:
The patent applies partial or excessive action by implementing a dual-fuse structure that allows for repeated programming attempts. Instead of using excessively high current that risks damage, the system can perform multiple attempts with moderate current through different fuses, achieving the necessary programming effect without causing harmful thermal or electrical stress to the chip.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The dual-fuse structure enhances programming success rates by reducing resistance and increasing the programming current, ensuring successful programming by ensuring the programming efficiency.
Implementation Method 1
the chip is irradiated by external light containing address information, a fuse located on a flag bit is blown, and logical information is transmitted to the chip to rewrite the corresponding internal logical value of the chip
Data Source
AI summary
Disclosed are an LED lamp bead chip with a dual-fuse structure and a programming method thereof, the LED lamp bead chip includes an IC chip, a plurality of groups of logical addresses are arranged in the IC chip, at least two fuses are arranged between each group of logical addresses, and the logical address adopts OR gate logic. The programming method is as follows: the chip is irradiated by external light containing address information, a fuse located on a flag bit is blown, and logical information is transmitted to the chip to rewrite the corresponding internal logical value of the chip.