Non-Contact Detection Panel for LED Defect Inspection
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Solution Overview
Problem
Existing detection methods for light-emitting diodes (LEDs) face challenges in aligning probes with small-sized electrodes, leading to defects and increased detection time, especially when dealing with numerous LEDs.
Innovation Solution
A detection panel with a substrate and multiple detection units, each comprising a first and second detection electrode, is used to detect electrical properties of LEDs after illumination, allowing for non-contact defect detection and reducing the time and effort required for inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a probe with an extremely small tip is used to detect small-sized LEDs, then the detection precision is improved, but the manufacturing difficulty and loss rate increase
Solution Approach 1:
The patent replaces the mechanical contact probe detection system with a non-contact detection system. The detection panel uses detection units that can detect electrical properties of LEDs without physical contact, eliminating the need for extremely small probe tips while maintaining detection precision for mini and micro LEDs.
Solution Approach 2:
The detection panel introduces an intermediary detection mechanism between the tester and the LED. Instead of directly contacting the LED electrode with a probe, the detection panel serves as an intermediary that detects electrical properties through its detection units, reducing both manufacturing difficulty and loss rate.
2Measurement precision
If a probe with an extremely small tip is used to detect small-sized LEDs, then the detection precision is improved, but the probe loss rate increases
Solution Approach 1:
The patent replaces the mechanical contact probe detection system with a non-contact detection system. The detection panel uses detection units that can detect electrical properties of LEDs without physical contact, eliminating the need for extremely small probe tips while maintaining detection precision for mini and micro LEDs.
3Reliability
If probes contact electrodes sequentially for detection, then the detection process is completed, but the detection time increases
Solution Approach 1:
The patent merges multiple detection functions into a single detection panel. The detection panel includes multiple detection units that can simultaneously detect electrical properties of multiple LEDs or different electrodes of a single LED, eliminating the need for sequential probe contact and significantly reducing detection time.
Solution Approach 2:
The patent transitions from one-dimensional sequential detection (single probe moving between electrodes) to two-dimensional parallel detection (multiple detection units operating simultaneously). The detection panel can detect multiple electrical properties at once, dramatically reducing detection time while maintaining completeness.
4Measurement precision
If probes physically contact LED electrodes for detection, then the electrical property measurement is achieved, but the risk of damage increases
Solution Approach 1:
The patent replaces the mechanical contact probe detection system with a non-contact detection system. The detection panel uses detection units that can detect electrical properties of LEDs without physical contact, eliminating the need for extremely small probe tips while maintaining detection precision for mini and micro LEDs.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The proposed solution enables efficient detection of defects in small-sized LEDs without physical contact, reducing the risk of damage and improving the yield of subsequent products by allowing for full inspection of a large number of LEDs in a shorter time.
Implementation Method 1
the plurality of detection units detect an electrical property generated after the light-emitting unit is illuminated with light
Data Source
AI summary
A detection panel for detecting a light-emitting unit including a substrate and a plurality of detection units is provided. The plurality of detection units are disposed on the substrate, wherein one of the plurality of detection units includes a first detection electrode and a second detection electrode, and there is a first specific distance between the first detection electrode and the second detection electrode. There is a second specific distance between the plurality of detection units and the corresponding light-emitting unit, and the plurality of detection units detect an electrical property generated after the light-emitting unit is illuminated with light to determine whether the light-emitting unit has defects or not. A detection device including the detection panel is also provided.


