LED Electrode Layout for Current Spreading and Flip-Chip Reliability

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Solution Overview

Problem

Conventional light-emitting diodes (LEDs) face challenges in current spreading and heat dissipation, leading to potential line breakage when forming flip-chip structures, which affects the yield rate of optoelectronic devices.

Innovation Solution

The optoelectronic device features a semiconductor stack with a specific electrode pattern design, including multiple conductive type electrodes and insulating layers, optimized for current spreading and reduced height differences between electrodes to minimize line breakage during flip-chip formation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional electrode patterns are used in LEDs, then the structure is simple, but current spreading is poor and line breakage occurs during flip-chip formation

Engineering Contradiction:
Improveline breakage probabilityVSAvoidelectrode pattern complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The electrode pattern is divided into multiple segments including a first electrode pattern on the first semiconductor layer, a second electrode pattern on the second semiconductor layer, and a third electrode pattern on the insulating layer. This segmentation allows current to spread through multiple paths, reducing line breakage probability while managing the complexity through systematic distribution of electrode functions.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The electrode structure extends from a single-plane configuration to a multi-layer three-dimensional arrangement. The first electrode pattern is positioned on the first semiconductor layer, the second electrode pattern on the second semiconductor layer, and the third electrode pattern on the insulating layer, creating vertical stacking that enhances current spreading in multiple dimensions and reduces line breakage.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Temperature

If conventional electrode designs are used, then manufacturing is simple, but heat dissipation is insufficient

Engineering Contradiction:
Improveheat dissipation efficiencyVSAvoidmanufacturing complexity
Core Design Contradiction:
TemperatureVSEase of manufacture

Solution Approach 1:

The heat dissipation function is segmented across multiple electrode patterns and layers. The first electrode pattern contacts the first semiconductor layer, the second electrode pattern contacts the second semiconductor layer, and the third electrode pattern provides additional thermal pathways through the insulating layer, creating multiple heat dissipation channels that improve thermal management.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The electrode structure utilizes composite material arrangements with conductive electrode patterns positioned on semiconductor layers and insulating layers with specific dielectric properties. This composite structure optimizes both electrical connectivity and thermal dissipation while maintaining manufacturability through established semiconductor fabrication processes.

Inventive Principle:
Principle #40Composite materials

3Reliability

If electrode height differences are large, then electrical connection is achieved, but line breakage probability increases during flip-chip formation

Engineering Contradiction:
Improveline breakage probabilityVSAvoidelectrode height control
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The electrode structure transitions from a single-plane configuration to a multi-layer vertical arrangement. By distributing electrode patterns across different vertical levels (first semiconductor layer, second semiconductor layer, and insulating layer), the design reduces height differences within each layer while maintaining effective electrical connections through the stacked configuration.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

Each electrode pattern is optimized for its specific location and function. The first electrode pattern is designed for contact with the first semiconductor layer, the second electrode pattern for the second semiconductor layer, and the third electrode pattern for the insulating layer, with each pattern's geometry and dimensions tailored to its local electrical and mechanical requirements.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The electrode pattern design enhances current spreading and reduces the probability of line breakage, thereby improving the yield rate of optoelectronic devices by ensuring efficient electrical connections and heat dissipation.

Implementation Method 1

a third electrode formed on the first insulating layer and including a first extended portion and a second extended portion, wherein the first extended portion is electrically connected to the first semiconductor layer through the first group of the first openings, the second extended portion is electrically connected to the first semiconductor layer through the second group of the first openings

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Implementation Method 2

The lighting theory of light-emitting diodes (LEDs) is to transform electrical energy to optical energy by applying electrical current to the LED and injecting electrons and holes to the active layer, where the electrons and holes recombine to emit light

Methodology Applied
Scientific EffectElectroluminescence: Electroluminescence

Data Source

PatentUS11908975B2Optoelectronic device and method for manufacturing the same
Publication Date: 2024.02.20 ENNOSTAR CORP
  • US11908975B2 patent drawing
  • US11908975B2 patent drawing
  • US11908975B2 patent drawing

AI summary

An optoelectronic device includes a first semiconductor layer, a second semiconductor layer and an active layer between the first semiconductor layer and the second semiconductor layer; a first insulating layer on the second semiconductor layer and including a plurality of first openings exposing the first semiconductor layer, wherein the first openings include a first group and a second group; a third electrode on the first insulating layer and including a first extended portion and a second extended portion, wherein the first extended portion and the second extended portion are respectively electrically connected to the first semiconductor layer through the first group of the first openings and the second group of the first openings, and wherein the number of the first group of the first openings is different from the number of the second group of the first openings; and a plurality of fourth electrodes on the second insulating layer and electrically connected to the second semiconductor layer, wherein in a top view of the optoelectronic device, the first extended portion is located between the fourth electrodes.