LED Inspection Apparatus Using Visible and UV Light
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Solution Overview
Problem
Current LED inspection methods are inefficient in simultaneously assessing appearance and emission characteristics, particularly due to the use of mechanical shutters and UV lamps, which hinder high-speed inspection and increase maintenance costs.
Innovation Solution
An LED inspection apparatus and method that uses a combination of visible and UV lighting units, a beam splitting unit, and image processing to generate and analyze image data, enabling simultaneous inspection of appearance and emission characteristics, with a determination unit to identify defects by comparing image data against reference standards.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a mechanical shutter is used to control UV lamp light emission, then the inspection can be performed, but the inspection speed is reduced and the apparatus lifespan is reduced
Solution Approach 1:
The patent replaces the mechanical shutter system with an electronic shutter controlled by a controller. The controller electrically controls the UV lamp's light emission based on inspection requirements, eliminating mechanical moving parts. This substitution increases inspection speed by enabling faster, more precise light control while improving apparatus reliability by removing mechanical wear and extending the UV lamp's operational lifespan.
2Measurement precision
If UV lamp is used for emission characteristic inspection, then emission characteristics can be inspected, but initial expenses and maintenance expenses increase
Solution Approach 1:
The patent makes the UV lamp serve multiple functions: it acts as both the inspection light source for emission characteristics and a component integrated with the electronic shutter control system. The controller manages the UV lamp's operation efficiently, enabling the system to perform both appearance inspection (using visible light) and emission characteristic inspection (using UV light) without requiring separate dedicated systems, thereby reducing overall initial and maintenance expenses.
3Measurement precision
If separate inspection methods are used for appearance and emission characteristics, then each can be inspected, but the inspection process becomes complex and time-consuming
Solution Approach 1:
The patent merges appearance inspection and emission characteristic inspection into a single integrated inspection apparatus. The system combines visible light illumination for appearance inspection and UV light illumination for emission characteristic inspection within one device, controlled by a unified controller. This integration allows both inspection types to be performed simultaneously or in sequence without requiring separate inspection processes, reducing complexity and inspection time while maintaining accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for high-speed, cost-effective inspection of LED defects, reducing maintenance costs and improving inspection efficiency by enabling simultaneous evaluation of appearance and emission characteristics.
Implementation Method 1
a beam splitting unit to reflect the emitted visible light and transmit the reflected visible light to the LED
Implementation Method 2
to provide the visible light reflected from the LED to the photographing unit by transmitting the visible light
Implementation Method 3
a second lighting unit to emit ultraviolet (UV) light to the LED
Implementation Method 4
The UV light reflected from the LED may include a wavelength-converted light of which a wavelength is converted by the LED and the phosphor
Implementation Method 5
a photographing unit to generate at least one first image data by photographing the visible light reflected from the LED and to generate at least one second image data by photographing the UV light reflected from the LED
Implementation Method 6
a color filter disposed at an upper portion of the LED to pass the wavelength-converted light which is included in the UV light reflected from the LED and to filter the UV light
Data Source
AI summary
A light emitting diode (LED) inspection apparatus includes at least one LED including a phosphor applied on an emission surface, a first lighting unit to emit visible light to the LED, a second lighting unit to emit ultraviolet (UV) light to the LED, a photographing unit to generate at least one first image data by photographing the visible light reflected from the LED and to generate at least one second image data by photographing the UV light reflected from the LED, and a determination unit to determine a defect in appearance and emission characteristics of the LED using the at least one first image data and second image data.