LED Display Pixel Internal Test Circuit Design

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing light-emitting diode (LED) display pixels require complex signal transmission for testing, which can be challenging due to the need for adapting signals to the specific configuration of the driving circuit.

Innovation Solution

A display pixel design that includes a dual-module electronic driving circuit, where a first module activates or deactivates a second module based on supply voltage and signal inputs, allowing for internal test operations without external signal adaptation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If complex external signal transmission is used for testing display pixels, then test operations can be performed, but the device complexity and difficulty of operation increase

Engineering Contradiction:
Improvetest operation capabilityVSAvoidsignal transmission complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The display pixel performs self-testing through internal test circuits that generate test signals locally. The pixel activates its own test mode by detecting specific voltage conditions on its conductive pads, eliminating the need for external test equipment to generate and transmit complex test signals. This self-service approach simplifies the testing process while maintaining reliable test capability.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The same conductive pads used for normal display operation are also used for test operations. The electronic driving circuit is designed to function in both normal display mode and test mode, with the ability to detect test conditions and switch between modes. This multi-functionality reduces the need for separate test interfaces and simplifies the overall system.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Ease of manufacture

If display pixels are designed with embedded driving circuits (smart pixels), then manufacturing is simplified, but test operations become more complex due to circuit configuration dependencies

Engineering Contradiction:
Improvemanufacturing simplificationVSAvoidtest operation complexity
Core Design Contradiction:
Ease of manufactureVSEase of operation

Solution Approach 1:

The smart pixel's embedded driving circuit includes self-testing capability. The circuit automatically detects when it is in test mode by monitoring the voltage conditions on its conductive pads and activates internal test signal generation. This eliminates the need for external equipment to understand or adapt to the specific circuit configuration, making testing as easy as manufacturing.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

Instead of having external test equipment adapt to the pixel's circuit configuration, the pixel's driving circuit is designed to generate and respond to test signals internally. The circuit inverts the traditional testing approach by making the device under test the source of test signals rather than the recipient, thereby simplifying the operation for the user.

Inventive Principle:
Principle #13The other way round (Inversion)

3Device complexity

If the number of conductive pads is reduced in display pixels, then device size and complexity are reduced, but test operation capability may be limited

Engineering Contradiction:
Improvenumber of conductive padsVSAvoidtest operation capability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The conductive pads are designed to serve multiple functions: they carry power and data signals during normal operation and simultaneously serve as test signal inputs and outputs when test mode is activated. The driving circuit detects test mode through voltage conditions on these same pads and switches to internal test signal generation, maintaining full test capability with fewer physical pads.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent combines the normal operation interfaces and test interfaces into a single set of conductive pads. The same physical pads that receive power and data during display operation are also used for test signal transmission. The driving circuit merges the control logic for both modes, allowing the system to switch between normal and test operations without requiring separate physical interfaces.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Simplifies the test operation process by allowing the display pixel to perform internal testing without the need for complex external signal transmission, reducing the number of conductive pads and enhancing operational efficiency.

Implementation Method 1

at least one light-emitting diode and one electronic circuit for driving said light-emitting diode

Methodology Applied
Scientific EffectLight emission from light-emitting diode: Light Emitting Diode

Data Source

PatentUS20250054424A1Display pixel with light-emitting diodes for display screen
Publication Date: 2025.02.13 ALEDIA INC
  • US20250054424A1 patent drawing
  • US20250054424A1 patent drawing
  • US20250054424A1 patent drawing

AI summary

A display pixel comprising at least one light-emitting diode, an electronic circuit for driving the light-emitting diode, and first and second conductive pads, the first pad being coupled to the light-emitting diode, the driving circuit being configured in normal operation to drive the light-emitting diode on the basis of first signals received on the second pad, the driving circuit comprising first and second modules, the first module being coupled to the first and second pads, and being configured to activate or deactivate the second module on the basis of the supply voltage received on the first pad and first signals received on the second pad, the second module being configured, when activated, to deliver second signals for driving the light-emitting diode for a test operation.