LED Resistance Measurement via Radiative Current Segmentation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing methods for measuring the resistance of light-emitting diodes (LEDs) are inaccurate due to their dependence on the slope of the voltage-current curve and the uncertainties in the Shockley diode equation, making it difficult to distinguish between issues in the LED element and the circuit it is mounted in.
Innovation Solution
A method and device that separate the injected current into radiative and non-radiative current components using internal quantum efficiency, allowing for the computation of resistance values through modeling and voltage differences, enabling non-destructive measurement and diagnosis of LED performance issues.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the slope of the voltage-current curve is used to measure resistance, then the measurement can be obtained, but the resistance component value changes very large depending on the magnitude of the injected current and cannot express the voltage drop caused by an accurate resistance component
Solution Approach 1:
The patent segments the total current into two distinct components: radiative current (I_rad) and non-radiative current (I_nonrad). By separating these current components, the measurement method can independently analyze the voltage drop characteristics of each component, thereby achieving accurate resistance measurement without the large variations caused by total current magnitude changes.
Solution Approach 2:
The patent changes the measurement parameter from total current to separated current components (radiative and non-radiative). By measuring the voltage drop across each current component separately and using the internal quantum efficiency as a conversion factor, the method achieves accurate resistance values that are not affected by the magnitude of the injected current.
2Ease of manufacture
If the Shockley diode equation is used to approximate resistance, then a resistance value can be obtained, but the measurement accuracy is reduced due to the uncertainty inherent in the Shockley diode equation
Solution Approach 1:
The patent introduces internal quantum efficiency as an intermediary parameter that connects the easily measurable total current to the separated current components. This intermediary allows the method to maintain simplicity (ease of manufacture) while achieving high measurement precision, as the internal quantum efficiency serves as a reliable conversion factor between total current and radiative/non-radiative current components.
3Measurement precision
If traditional resistance measurement methods are used, then the resistance value can be obtained, but it is difficult to determine whether a problem is due to a problem in the circuit of the product or a problem in the light-emitting diode element itself
Solution Approach 1:
By segmenting the current into radiative and non-radiative components, the patent provides separate resistance measurements for each component. This segmentation preserves diagnostic information, allowing users to determine whether problems originate from the LED element itself (elemental resistance) or from the circuit (circuit resistance), as each current component has distinct characteristics and measurement requirements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Accurately measures LED resistance values, differentiating between manufacturing process and semiconductor crystal growth influences, and identifying whether problems arise from the LED element or the circuit, aiding in performance improvement and design optimization.
Implementation Method 1
The light-emitting diode is a sort of p-n junction diode and is a semiconductor element that utilizes electroluminescence, which describes the phenomenon of monochromatic light being emitted when a voltage is applied in a forward direction.
Data Source
AI summary
Disclosed are a method and device for measuring the resistance of a light-emitting diode that can measure the resistance value of the light-emitting diode accurately in a non-destructive manner. The disclosed method may include: measuring a first radiative current component of an injected current for the light-emitting diode by using the internal quantum efficiency of the light-emitting diode; generating a second radiative current component by modeling the first radiative current component; and computing a resistance value of the light-emitting diode by using the first and second radiative current components resulting from an applied voltage to the light-emitting diode.