LED Lamp Testing Apparatus with Up and Down Shifter

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing methods for testing light emitting diode (LED) lamps are inefficient, often requiring excessive time and cost, and cannot perform comprehensive testing simultaneously on multiple LEDs.

Innovation Solution

A testing apparatus and method that uses an up and down shifter with sensors and a controller to move an LED lamp to a measurement position, measure its quality using optical and electric power characteristics, and display the results, allowing for simultaneous testing of multiple LEDs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If traditional testing methods are used, then testing can be performed, but test time and cost are excessive and multiple LEDs cannot be tested simultaneously

Engineering Contradiction:
Improvetesting efficiencyVSAvoidtest time
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

The testing apparatus is divided into multiple independent testing units, each capable of testing one or more LED lamps simultaneously. Each unit includes its own up and down shifter, sensor, and controller, allowing parallel operation and significantly increasing overall testing productivity while reducing total test time

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The testing apparatus is designed with universal components that can handle multiple types of LED lamps. The up and down shifter mechanism, sensor system, and controller are configured to accommodate various LED lamp specifications, enabling a single apparatus to perform comprehensive testing on different LED types simultaneously

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Productivity

If an up and down shifter mechanism is introduced to move LED lamps to measurement positions, then simultaneous testing of multiple LEDs is enabled, but device complexity increases

Engineering Contradiction:
Improvesimultaneous testing capabilityVSAvoidapparatus structure
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The up and down shifter is designed as a dynamic mechanism that can automatically adjust the position of LED lamps between initial and measurement positions. The shifter incorporates sensors that detect lamp positions and trigger automatic movement, reducing the need for complex manual positioning systems and simplifying overall device operation

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The testing apparatus incorporates self-servicing features where the up and down shifter automatically positions LED lamps based on sensor feedback, and the system autonomously controls the timing of measurements. This self-positioning and self-timing capability reduces the need for complex external control mechanisms and simplifies the overall device architecture

Inventive Principle:
Principle #25Self-service

3Measurement precision

If sensors and automatic positioning are used, then measurement precision is improved, but ease of operation decreases

Engineering Contradiction:
Improvequality measurement accuracyVSAvoidsystem operation simplicity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

Sensors are integrated into the up and down shifter to provide real-time feedback on LED lamp positions. This feedback mechanism automatically triggers the measurement process when lamps reach the correct measurement position, ensuring precise measurements while simplifying operator intervention to merely initiating the testing sequence

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS8670112B2Testing apparatus for testing light emitting diode lamp and method for operating the same
Publication Date: 2014.03.11 SUZHOU LEKIN SEMICON CO LTD
  • US8670112B2 patent drawing
  • US8670112B2 patent drawing
  • US8670112B2 patent drawing

AI summary

Disclosed is a method for operating a test apparatus for an LED lamp. The method includes: forming a self-holding circuit by switching on a first switching means such that an up and down shifter provided in the test apparatus for the LED lamp moves down; moving down and stopping the up and down shifter from a determined initial position to a measurement position; measuring the quality of the LED lamp equipped with the test apparatus for the LED lamp; releasing the self-holding circuit by switching on the second switching means such that the up and down shifter moves up; and moving up and down shifter from the measurement position to the determined initial position.