LED Water Content Measurement Matrix Correction

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Solution Overview

Problem

Infrared water content measuring apparatuses face accuracy issues due to broad spectrum radiation beams with narrow half-value widths, leading to increased size, cost, and radiation attenuation, and require narrow band-pass filters which are prone to wear and failure.

Innovation Solution

A material property measuring apparatus using LEDs as radiation sources with broad half-value widths, correcting detected intensities with a square matrix-based correction coefficient to calculate an index value for accurate water content measurement, eliminating the need for narrow band-pass filters and reducing mechanical complexity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If narrow band-pass filters are used to obtain radiation beams with extremely narrow half-value widths, then measurement precision is improved, but device complexity increases and reliability decreases due to mechanical wear

Engineering Contradiction:
Improvemeasurement precisionVSAvoidreliability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent extracts and eliminates the band-pass filter component from the measurement system. Instead of using filters to narrow the spectrum, the invention directly uses LEDs with inherently broad spectra and applies mathematical correction to achieve accurate measurements without the unreliable mechanical filtering mechanism.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent replaces the mechanical band-pass filter system with an electronic/mathematical correction system. The rotation of the filter wheel and mechanical filtering is substituted by LED selection and computational correction algorithms, eliminating mechanical wear and improving reliability.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If narrow band-pass filters are used to obtain radiation beams with extremely narrow half-value widths, then measurement precision is improved, but device complexity and size increase

Engineering Contradiction:
Improvemeasurement precisionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent removes the complex mechanical filter wheel assembly and narrow band-pass filters from the system. The solution extracts only the essential function of wavelength selection, achieving it through simpler LED sources and computational methods rather than complex optical filtering.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent substitutes the mechanical filter wheel system with electronic control of LED arrays. The complexity of mechanical rotation, filter positioning, and alignment is replaced by electronic switching and digital signal processing, significantly reducing device complexity.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If narrow band-pass filters are used to obtain radiation beams with extremely narrow half-value widths, then measurement precision is improved, but radiation attenuation increases

Engineering Contradiction:
Improvemeasurement precisionVSAvoidradiation attenuation
Core Design Contradiction:
Measurement precisionVSLoss of energy

Solution Approach 1:

The patent converts the harmful effect of broad LED spectra into a benefit by using mathematical correction. Instead of viewing the broad spectrum as a problem to be filtered out, the invention uses it as the starting point and applies correction algorithms to achieve precise measurements, thereby eliminating radiation attenuation from filtering.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Solution Approach 2:

The patent changes the approach from physical spectrum narrowing to computational parameter correction. By measuring the actual spectral output of LEDs and applying correction coefficients to the detected signals, the system achieves precision without the energy loss associated with narrow band-pass filtering.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables high-accuracy water content measurement without the need for narrow spectrum radiation, reducing apparatus size, cost, and mechanical wear, while improving reliability and maintenance ease.

Implementation Method 1

radiation source irradiator that irradiates a measurement target material with radiation beams having n different wavelengths... using LEDs as radiation sources with broad half-value widths

Methodology Applied
Scientific EffectLight Emitting Diode: Light Emitting Diode

Implementation Method 2

radiation having such a wavelength as to be absorbed by water and not to be absorbed by cellulose which is the main component of paper and radiation having such a wavelength as to be absorbed by cellulose and not to be absorbed by water

Methodology Applied
Scientific EffectAbsorption (EM radiation): Absorption (EM radiation)

Implementation Method 3

detector that detects intensities of radiation beams having the respective wavelengths after the irradiation of the measurement target material... radiation receiver such as a PbS cell

Methodology Applied
Scientific EffectPhotoelectric Effect: Photoelectric Effect

Data Source

PatentUS9170194B2Material property measuring apparatus
Publication Date: 2015.10.27 YOKOGAWA ELECTRIC CORP
  • US9170194B2 patent drawing
  • US9170194B2 patent drawing
  • US9170194B2 patent drawing

AI summary

A material property measuring apparatus includes a radiation source irradiator configured to irradiate a measurement target material with radiation beams having n different wavelengths, a detector configured to detect intensities of radiation beams having the respective wavelengths after the irradiation of the measurement target material, and a processing unit configured to correct the detected intensity of the radiation beam having at least a part of the respective wavelengths using a correction coefficient in which rows and columns are respectively represented by a matrix of an order of n or less, and to calculate an index value indicating a property of the measurement target material on the basis of relative intensities of the radiation beams having the respective wavelengths after the correction.