Lens Array Measurement Structures for Optical Decenter Error
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Solution Overview
Problem
Microlens arrays suffer from optical decenter errors due to axial misalignment, which are difficult to accurately measure using conventional equipment, leading to inefficiencies and variability in measurement precision.
Innovation Solution
A lens array design with measurement structures on opposing lens surfaces, allowing for rapid optical decenter error measurement using image measuring instruments, enabling precise correction of misalignment without requiring collimators or contact-type equipment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional contact-type or optical measurement equipment (such as TRIOPTICS collimator) is used to measure axial misalignment, then measurement capability is provided, but measurement time increases significantly and measurement precision shows significant variability
Solution Approach 1:
The patent creates simplified 2D projection copies of the 3D lens array structure by projecting lens profiles onto a measurement plane. This allows standard 2D image measuring instruments to accurately measure axial misalignment without requiring complex 3D optical measurement equipment like collimators, thereby reducing both measurement time and equipment costs while maintaining precision
Solution Approach 2:
The patent replaces complex optical measurement systems (collimators) with simpler image processing-based measurement methods. By using 2D profile projections and computational analysis instead of sophisticated optical setups, the system achieves accurate axial misalignment measurement with reduced time and equipment requirements
2Productivity
If mold precision is estimated without actual measurement, then measurement process is simplified, but actual axial misalignment values cannot be obtained and mold precision cannot be adjusted based on measured data
Solution Approach 1:
The patent enables the lens array manufacturing system to perform self-measurement and self-validation. By incorporating measurable lens profiles directly into the lens array structure and using image measuring instruments to capture and analyze these profiles, the system can independently determine actual axial misalignment values and use this data to adjust mold precision, eliminating the need for external estimation methods
3Productivity
If microlens arrays are fabricated using molds, then manufacturing efficiency is improved, but optical decenter errors occur due to axial misalignment that are difficult to measure
Solution Approach 1:
The patent creates measurable 2D projection copies of the lens structure that reveal axial misalignment information. By projecting lens profiles onto a measurement plane and analyzing the positions of these projections, the system can easily detect optical decenter errors without complex measurement equipment, maintaining both manufacturing efficiency and measurement capability
Solution Approach 2:
The patent transforms the measurement problem by changing from direct 3D axial measurement to 2D profile position measurement. By analyzing the horizontal and vertical positions of lens profiles in projected images, the system converts a difficult-to-measure parameter (axial misalignment) into easily measurable 2D coordinates, thereby reducing measurement difficulty while maintaining manufacturing efficiency
Data Source
AI summary
A lens array with measurement structures includes a first lens surface and a second lens surface opposite to each other and arranged along a first direction. The first lens surface has a first feature structure, a second feature structure and a third feature structure, and the second lens surface has a fourth feature structure, a fifth feature structure and a sixth feature structure corresponding respectively to the first feature structure, the second feature structure and the third feature structure. A shape center of the first feature structure is offset from that of the fourth feature structure, a shape center of the second feature structure is offset from that of the fifth feature structure, and a shape center of the third feature structure is offset from that of a sixth feature structure relative to the first direction.