Level Set Discrete Element Method for Particle Morphology Simulation

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Solution Overview

Problem

Current methods for simulating particulate systems, such as clustering and polyhedra-based techniques, are limited in capturing three-dimensional particle morphology, particularly in representing curvature and accurately predicting macroscopic properties like strength and permeability in granular materials.

Innovation Solution

The level set discrete element method (LS-DEM) uses level set functions to model particles with arbitrary shapes, allowing for accurate representation of particle morphology and simulation of particle interactions, including contact detection and motion calculation, using image data from techniques like X-ray computed tomography.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If clustering technique is used to model particles, then implementation simplicity is improved, but particle curvature representation is worsened

Engineering Contradiction:
Improveimplementation simplicityVSAvoidparticle curvature representation
Core Design Contradiction:
Ease of manufactureVSShape

Solution Approach 1:

The particle surface is segmented into multiple discrete points (nodes) that collectively represent the curved geometry. This allows the complex curved surface to be broken down into manageable discrete elements that can be processed computationally while preserving the overall curvature characteristics.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The approach transitions from representing particles in traditional 3D space to incorporating a fourth dimension through the level set function signature. This additional dimension enables accurate representation of complex curved surfaces and arbitrary particle morphologies that cannot be adequately captured by conventional 3D geometric primitives.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Shape

If polyhedra technique is used to model particles, then complex geometry representation is improved, but contact detection complexity is worsened

Engineering Contradiction:
Improvecomplex geometry representationVSAvoidcontact detection algorithm complexity
Core Design Contradiction:
ShapeVSDevice complexity

Solution Approach 1:

The particle surface is segmented into discrete points (nodes) rather than continuous polyhedral faces. This segmentation simplifies contact detection by reducing the problem from face-to-face or node-to-face contact checks to simpler node-to-node contact checks, while still accurately representing complex particle geometries.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The continuous particle surface is copied or represented by a discrete set of points distributed across the surface. This discrete point representation maintains the geometric fidelity of complex particles while enabling computationally efficient contact detection algorithms that operate on discrete elements rather than continuous surfaces.

Inventive Principle:
Principle #26Copying

3Productivity

If traditional particle modeling methods are used, then computational efficiency is improved, but particle morphology accuracy is worsened

Engineering Contradiction:
Improvecomputational efficiencyVSAvoidparticle morphology accuracy
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The particle morphology is segmented into a discrete set of points (nodes) distributed across the particle surface. This segmentation enables computationally efficient processing while capturing essential morphological features such as sphericity, roundness, and roughness that are critical for predicting macroscopic granular material behavior.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The approach changes the fundamental parameters used to represent particles from traditional geometric primitives (spheres, polyhedra) to a more flexible point-based representation with associated level set functions. This parameter change enables accurate representation of arbitrary particle morphologies while maintaining computational efficiency through discrete element methods.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

LS-DEM enables the simulation of large-scale granular assemblies with high fidelity, accurately capturing particle shape and behavior, including shear banding trends, while being computationally efficient, unlike traditional methods that often underestimate or overestimate particle properties.

Implementation Method 1

image data captured using x-ray computed tomographic techniques

Methodology Applied
Scientific EffectX-ray computed tomography: Tomography

Implementation Method 2

X-ray CT utilizes computer-processed X-rays to produce tomographic images

Methodology Applied
Scientific EffectX-ray attenuation: X-Ray

Data Source

PatentUS11341294B2Systems and methods for level set discrete element method particle simulation
Publication Date: 2022.05.24 CALIFORNIA INST OF TECH
  • US11341294B2 patent drawing
  • US11341294B2 patent drawing
  • US11341294B2 patent drawing

AI summary

Systems and methods for level set discrete element method particle simulation in accordance with embodiments of the invention are disclosed. In one embodiment, a particle simulation device includes a processor and a memory storing a particle analysis application, wherein the processor, on reading the particle analysis application obtains image data describing a plurality of particles, models a plurality of grains based on the image data, where each modeled grains includes a level set function corresponding to one of the plurality of particles, calculates the motion of each of the plurality of grains based on a force applied to the plurality of grains, and generates a transformed particle model based on the plurality of grains and the calculated motion.