Level and Surface Temperature Gauge for Uneven Material
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Solution Overview
Problem
Existing level gauge systems for industrial processes, particularly those using top-down measurements, struggle with accurately measuring the level and volume of solid materials with uneven surfaces, and they often fail to provide comprehensive temperature measurements, leading to potential adverse environmental conditions.
Innovation Solution
A level and surface temperature gauge system that combines a level scanner and a thermographic imaging device with infrared detectors and temperature measurement circuitry, capable of generating accurate measurements at multiple locations on the surface of the material, thereby addressing the limitations of existing systems.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If non-contacting radar level gauge systems are used to measure material level, then the measurement can be performed from a distance, but the uneven material surface causes signal redirection away from the device resulting in inaccurate measurements
Solution Approach 1:
The patent divides the measurement task into multiple discrete measurement points across the material surface. The level gauge takes individual measurements at multiple locations and calculates an average level, rather than attempting a single comprehensive measurement that would be affected by surface unevenness
Solution Approach 2:
The system performs more measurements than a single point measurement would provide, taking readings at multiple locations across the material surface. This excessive sampling approach ensures that even if some measurements are affected by surface conditions, the overall average remains accurate
2Measurement precision
If temperature probes are used to detect surface temperature, then point temperature measurements can be obtained, but the probes are subject to strain from bulk goods causing deterioration and inaccurate readings
Solution Approach 1:
The patent replaces mechanical temperature probes that physically contact the material with a non-contacting infrared temperature gauge. This substitution eliminates mechanical strain and physical contact issues while providing reliable temperature measurements across multiple points on the material surface
3Loss of information
If point temperature measurements are taken using temperature probes, then specific location temperatures can be detected, but temperature concerns between probes remain undetected
Solution Approach 1:
The infrared temperature gauge performs multiple functions simultaneously - it can measure temperature at multiple points across the entire material surface in a single operation, rather than requiring multiple individual probes placed at different locations. This multi-functional approach eliminates measurement gaps while avoiding the complexity of deploying and maintaining multiple probes
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The proposed gauge system provides accurate and comprehensive level and temperature measurements across multiple locations, enabling effective environmental control and reducing the risk of adverse conditions such as moisture accumulation and insect infestations.
Implementation Method 1
a thermographic imaging device with an array of infrared detectors... configured to generate temperature measurements of the material surface at a plurality of locations on the surface
Data Source
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AI summary
A level and surface temperature gauge (102) includes a housing structure (140), a level scanner (112), and a temperature scanner (114). The level scanner (112) is supported by the housing structure (140) and is configured to generate surface level measurements of a process material surface (116) at a plurality of locations on the surface (116). The temperature scanner (114) is supported by the housing structure (140) and is configured to generate temperature measurements of the process material surface (116) at a plurality of locations on the surface (116).