Light Guide Plate Selection Method for Backlight Modules

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Solution Overview

Problem

The existing methods for selecting light guide plates (LGP) in backlight modules for LCDs are labor-intensive and costly, leading to delays in the manufacturing process due to the occurrence of pattern mura effects, which are difficult to address without extensive trial and error.

Innovation Solution

A method involving the calculation of mura indexes and the creation of a mapping database to determine critical dot dimensions for LGP types, allowing for the selection of optimal film structures that minimize mura effects, thereby reducing labor and manufacturing costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Illumination intensity

If film structures with different brightness gains are selected to adjust backlight brightness, then brightness and chromaticity can be adjusted, but pattern mura effect occurs due to changes in light guide plate properties

Engineering Contradiction:
Improvebacklight brightnessVSAvoidpattern mura effect
Core Design Contradiction:
Illumination intensityVSObject-generated harmful factors

Solution Approach 1:

The patent calculates mura indexes in advance for different LGP types and film structure combinations before actual manufacturing. By pre-determining which combinations are likely to cause mura effects and selecting appropriate LGP types beforehand, the patent prevents pattern mura effects from occurring during production, thereby resolving the contradiction between adjusting brightness and avoiding mura effects.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If try and error method is used to generate film structure parameters to identify pattern mura, then pattern mura can be identified, but labor power and manufacturing cost increase significantly

Engineering Contradiction:
Improvepattern mura identificationVSAvoidmanufacturing efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent replaces the manual try-and-error method with a mathematical calculation model. By using the mura index formula MI=D1*T1/(P1*P1) to predict pattern mura effects, the patent eliminates the need for extensive physical testing and manual adjustment, thereby significantly reducing labor costs and manufacturing time while maintaining accurate identification of mura effects.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Illumination intensity

If LED brightness and lighting power are increased to enhance illumination, then illumination of backlight module improves, but efficiency of LCD cannot be increased to meet high requirements

Engineering Contradiction:
Improvebacklight illuminationVSAvoidLED energy consumption
Core Design Contradiction:
Illumination intensityVSUse of energy by moving object

Solution Approach 1:

Instead of increasing LED brightness and power consumption, the patent changes the optical parameters of the backlight module by selecting appropriate light guide plate types and film structure combinations. By optimizing the mura index through parameter selection rather than increasing energy input, the patent achieves improved illumination efficiency while meeting LCD performance requirements.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS8775132B2Selecting method of light guide plate of backlight module
Publication Date: 2014.07.08 TCL CHINA STAR OPTOELECTRONICS TECHNOLOGY CO LTD
  • US8775132B2 patent drawing
  • US8775132B2 patent drawing
  • US8775132B2 patent drawing

AI summary

A selecting method of light guide plate of backlight module is described. The selecting method includes the steps of: calculating a plurality of mura indexes (MI) corresponding to a plurality of mura statuses of a plurality of first light guide plate (LGP) types, respectively; defining a plurality of film structures, wherein each of the film structures corresponds to each of mura indexes for mapping the mura indexes (MI) of the first LGP types with the film structures to construct a mapping database; and selecting one of the film structures and one of the mura indexes (MI) correspondingly from the mapping database for determining a critical dot dimension (CDD) of a second LGP type of the selected film structure. The selecting method avoids the mura, speed up the research and development procedure of the backlight module, labor cost and manufacturing cost when the LGP is assembled with the film structure.