LiDAR Distance Measurement With Two-Stage Focus Scanning

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Solution Overview

Problem

Existing LiDAR measuring apparatuses require complex configurations for low and high precision distance measurements, leading to reduced accuracy and increased complexity.

Innovation Solution

A measuring apparatus using a common configuration for focus position determination and distance measurement, incorporating a light source, focus adjuster, scanner, and photodetector, with a processing circuit that controls these components to perform first and second scan operations for accurate distance information generation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a complex configuration is used for both low and high precision distance measurements, then measurement coverage is improved, but device complexity increases

Engineering Contradiction:
Improvemeasurement coverageVSAvoidconfiguration complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent applies a single unified configuration that performs both low precision and high precision distance measurements. The processing circuit executes different scan operations (first scan for low precision, second scan for high precision) using the same hardware components, eliminating the need for separate configurations and reducing overall device complexity while maintaining measurement coverage.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If separate configurations are used for low and high precision measurements, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improvedistance measurement precisionVSAvoidconfiguration complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent implements dynamic scan operations where the processing circuit adaptively selects between first scan operations (for low precision requirements) and second scan operations (for high precision requirements). This dynamic approach allows the system to adjust measurement precision based on actual needs without maintaining separate static configurations, thereby reducing device complexity while preserving measurement precision capabilities.

Inventive Principle:
Principle #15Dynamics

3Measurement precision

If multiple scan operations are performed, then measurement accuracy is improved, but measurement time increases

Engineering Contradiction:
Improvedistance information accuracyVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent applies partial action by performing only the necessary scan operations. The processing circuit first attempts a first scan operation and only performs the additional second scan operation if high precision is required. This selective approach avoids unnecessary measurement time consumption while ensuring accurate distance information is obtained when needed, balancing measurement precision with time efficiency.

Inventive Principle:
Principle #16Partial or excessive action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Accurately generates distance information of irradiation points on an object using a simple configuration, enhancing measurement precision while reducing complexity.

Implementation Method 1

a light source that emits irradiation light for irradiating an object; a photodetector that detects reflected light from the object

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 2

an adjuster that adjusts a focus position of the irradiation light

Methodology Applied
Scientific EffectOptical focusing: Focusing

Data Source

PatentUS20250283981A1Measuring apparatus
Publication Date: 2025.09.11 PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO LTD
  • US20250283981A1 patent drawing
  • US20250283981A1 patent drawing
  • US20250283981A1 patent drawing

AI summary

A measuring apparatus includes a light source that emits irradiation light for irradiating an object; an adjuster; a scanner; a photodetector; and a processing circuit. The processing circuit performs a first scan operation by causing the scanner to change an irradiation angle, and causing the light source to emit the irradiation light, generates optical detection information through the first scan operation based on reflected light detected by the photodetector, causes the adjuster to set the focus position of a second scan operation based on the optical detection information through the first scan operation, performs the second scan operation by causing the scanner to change the irradiation angle, and causing the light source to emit the irradiation light, generates optical detection information through the second scan operation based on the reflected light detected by the photodetector, and generates distance information of the object based on the optical detection information.