Lien Code ECC Encoding for Memory Cell Cycling
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Solution Overview
Problem
Existing memory storage devices using non-volatile memory require efficient testing mechanisms to improve reliability and endurance, particularly in cycling memory cells with error-correcting codes, which is not conveniently addressed by current technologies.
Innovation Solution
The implementation of a Lien ECC scheme that allows for easy generation of a codeword and its one's complement, enabling convenient testing and cycling of memory cells by using a Lien Code-based encoding method and apparatus.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional ECC encoding schemes are used, then data reliability is improved through error correction, but testing and cycling of memory cells becomes inconvenient and complex
Solution Approach 1:
The patent applies parameter changes by modifying the encoding scheme to use Lien Code with specific properties where the complement of a codeword is also a valid codeword. This changes the mathematical parameters of the ECC scheme to enable convenient testing where all-zero and all-one patterns can be cyclically written to memory cells without complex decoding operations
2Reliability
If standard BCH or Hamming codes are used, then error correction capability is provided, but the process of cycling memory cells for endurance testing becomes time-consuming and complex
Solution Approach 1:
The patent utilizes the inversion property of Lien Code where the complement of any codeword is also a valid codeword. This allows testing engineers to write all-zero patterns and all-one patterns cyclically, knowing that both are valid codewords under Lien Code encoding, thereby simplifying endurance testing procedures and reducing testing time compared to conventional BCH or Hamming codes
3Reliability
If conventional ECC schemes are implemented, then data integrity is maintained, but the mechanism for convenient testing of memory cells is lacking
Solution Approach 1:
The patent implements a universal testing mechanism using Lien Code encoding that serves multiple functions: it maintains data integrity through error correction while simultaneously enabling convenient endurance testing. The encoding scheme itself provides the testing capability, eliminating the need for separate or complex testing mechanisms that would otherwise be required
Data Source
AI summary
An encoding method for a memory storage apparatus adopting a Lien ECC scheme is provided. The memory storage apparatus comprises an ECC encoder using a Lien Code. The encoding method includes: receiving a first data or a second data which is one's complement of the first data; and performing an encoding operation based on the Lien Code by the ECC encoder. The encoding operation includes: if the first data is received, generating a first codeword according to the first data; and if the second data is received, generating a second codeword which is one's complement of the first codeword according to the second data. In addition, a memory storage apparatus using the encoding method based on the Lien Code is also provided.