Light Deflector Incident Angle Measurement via Optical Fitting
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Solution Overview
Problem
Existing light deflector systems face challenges in accurately measuring the incident angle of a wavelength sweeping light source onto a diffraction grating due to deviations in optical component installation, leading to inaccuracies in emission angle calculations.
Innovation Solution
A light deflector parameter measurement device and method that includes a photodetector, a stage for moving the photodetector along specific axes, and calculation units to determine the incident angle and other parameters by fitting coordinates and wavelengths to a prescribed relational expression, allowing for precise measurement of the incident angle and emission angle relationship.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a graduated stage or fixing jig is used to improve incident angle accuracy, then measurement precision is improved, but device complexity and installation difficulty increase due to additional components and alignment requirements
Solution Approach 1:
The patent extracts the angle measurement function from complex mechanical fixing systems and implements it through optical measurement. By using a photodetector to capture light position and combining this with wavelength data, the system calculates incident and emission angles through computational geometry rather than mechanical precision, thereby eliminating the need for complex graduated stages and fixing jigs.
Solution Approach 2:
The patent replaces mechanical angle measurement systems (graduated stages, fixed mounting fixtures) with an optical measurement system. The photodetector detects light position optically, and the angle calculation is performed through computational algorithms that process both position and wavelength data, substituting mechanical precision with optical and computational methods.
2Ease of operation
If mechanical fixing methods are used to install optical components, then ease of operation is improved, but measurement precision deteriorates due to installation deviations and component contraction
Solution Approach 1:
The patent implements feedback by measuring the actual light position and wavelength during operation, then using this data to calculate and correct for angle deviations. The system continuously monitors the optical path and compensates for installation deviations through computational correction, allowing simple mechanical installation while maintaining high measurement precision through active feedback and correction.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables exact measurement of the incident angle and emission angle relationship, improving the accuracy of light deflection calculations and compensating for installation deviations in light deflector systems.
Implementation Method 1
A light deflector that causes a light beam output from a wavelength sweeping light source to be incident onto a diffraction grating and changes the emission angle of the light beam emitted from the diffraction grating (deflects light) according to a diffraction grating equation
Data Source
AI summary
A parameter measurement device of a light deflector includes a photodetector that receives output light from the light deflector, a biaxial translation automatic stage that moves the photodetector to a plurality of positions, and a signal processing device that calculates the wavelength of the output light of a wavelength sweeping light source for each time, calculates the wavelength of the light received from the light deflector by the photodetector based on the output signal of the photodetector and a previously-calculated wavelength, and calculates the incident angle of the output light beam of the wavelength sweeping light source onto the diffraction grating and an angle formed by an L-axis and a line perpendicular to the surface of the diffraction grating by performing fitting so that the coordinates of the photodetector that are obtained for each position of the photodetector and the wavelength of the light conform to a prescribed relational expression.