Linearly-Overlapping Light Measurement Head for Optical Mapping
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Solution Overview
Problem
Existing light measurement systems for monitoring transmittance and reflectance in manufacturing lack an end-to-end interlocking design of light source and detector modules, inconsistent light intensity, and temperature control, leading to inefficiencies and gaps in mapping during product inspection.
Innovation Solution
A light measurement system with an end-to-end interlocking design of light source and detector modules, an onboard light source reference function for consistent intensity, and a peripheral temperature function for temperature monitoring and control, enabling continuous linear mapping without moving parts and real-time sampling across a product's width.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If prior art uses a moving platform to exhaustively sample a linear segment, then measurement coverage is achieved, but mechanical complexity and potential measurement gaps are introduced
Solution Approach 1:
The measurement system is divided into multiple stationary measurement heads, each covering a specific segment of the work product width. Each head contains multiple light sources and detectors arranged to measure specific portions, collectively providing exhaustive coverage without moving parts.
Solution Approach 2:
The system transitions from a single moving measurement point to multiple stationary measurement points arranged in a two-dimensional array across the work product width. This spatial arrangement in another dimension (across the width rather than along a single scan path) eliminates the need for mechanical movement while maintaining comprehensive coverage.
2Measurement precision
If prior art uses expensive detector filtering and light dispersion, then measurement precision is improved, but system cost and complexity increase
Solution Approach 1:
Each measurement head is designed with specific light sources emitting at particular wavelengths and detectors tuned to those wavelengths, creating localized optimization for specific measurement needs. This allows precise measurement of particular optical properties (transmittance, reflectance, density) without requiring complex filtering systems across the entire apparatus.
Solution Approach 2:
The system uses multiple light sources with different emission parameters (wavelengths, intensities) and detectors with different sensitivity parameters to measure various optical properties. By changing these parameters rather than using complex filtering, the system achieves precise measurements with simpler components.
3Area of stationary object
If multiple light source modules are used to cover wider areas, then measurement coverage is improved, but light intensity consistency deteriorates
Solution Approach 1:
The system incorporates feedback mechanisms where detectors measure the actual light intensity from each source in real-time, and this information is used to adjust source output or compensate in the measurements. This ensures that even if individual sources vary in intensity, the overall measurement remains consistent across the full width coverage.
Solution Approach 2:
The system independently controls the intensity parameter of each light source to compensate for variations. By adjusting the operating parameters (current, voltage) of individual LED sources, the system maintains consistent illumination levels across all measurement positions, ensuring uniform measurement quality across the entire width.
4Device complexity
If measurement systems operate without temperature control, then device simplicity is maintained, but measurement reliability deteriorates due to temperature impacts on light sources and detectors
Solution Approach 1:
The measurement system incorporates self-monitoring temperature sensors that automatically detect temperature changes in light sources and detectors. The system then automatically compensates for these changes by adjusting measurement parameters or source intensity, maintaining reliable measurements without requiring complex external temperature control systems.
Solution Approach 2:
Temperature feedback from sensors positioned near light sources and detectors is used to dynamically adjust measurement parameters. When temperature changes are detected, the system compensates by adjusting light source output or detector sensitivity, ensuring measurement reliability while maintaining relatively simple hardware through intelligent control.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution provides exhaustive, real-time sampling and mapping of transmittance and reflectance across a product's width, reducing operating costs and downtime by eliminating gaps in measurement and ensuring consistent light intensity and temperature control.
Implementation Method 1
monitoring the transmittance of light through a work product or the reflectance of light from a work product
Implementation Method 2
monitoring the transmittance of light through a work product or the reflectance of light from a work product
Implementation Method 3
light detectors... to exhaustively map a linear segment of a work product
Data Source
AI summary
A linearly-overlapping light measurement system "measurement head" having one or more linearly-overlapping modular light sources each having individual light sources arranged in a geometric pattern, the light sources being single- or multi-wavelength and programmable to generate light that is transmitted through and/or reflected from a work piece to be detected by linearly-overlapping modular light detectors having individual light detectors arranged in a geometric pattern. The "measurement head" also has linearly-overlapping modular light detectors arranged in a geometric pattern to receive light emitted by the light sources. A computer controller coordinating the operation of the light source array and light detector array to automatically sense and record the light transmittance and/or reflectance of one or more spectral ranges in real time from the work piece and then adjust the work being performed on the work piece to attain pre-determined standards. Reference feedback circuitry is provided for monitoring the light sources in each light source module. The reference feedback circuitry adjusts the operating parameters of a light source module to ensure that the intensity and the chromatic output of the light therefrom remains at a consistent level.