Light Modulation Element for Phase-Shifted Microscopic Imaging
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Solution Overview
Problem
Existing microscopic imaging devices require mechanical mechanisms for adjusting spatial phases of light masks, making it cumbersome to change patterns and obtain multiple images, and they are not easily miniaturized.
Innovation Solution
A microscopic imaging device that uses a light modulation element to generate measurement light with arbitrary patterns, allowing for sequential phase movement without mechanical mechanisms, enabling easy pattern change and miniaturization.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If a mechanical mechanism (carriage) is used to move the mask for adjusting spatial phase, then the mask can be positioned at multiple locations, but the device complexity increases and the operation becomes cumbersome
Solution Approach 1:
The patent replaces the mechanical carriage system with a spatial light modulator (SLM) that uses optical fields to directly modulate and move the mask pattern. The SLM controls the phase and position of light waves optically, eliminating the need for mechanical movement of physical masks and carriages, thus reducing device complexity while maintaining pattern adjustment capability
Solution Approach 2:
The patent changes the control parameter from mechanical position to optical phase. By modulating the phase of light waves through the SLM, the mask pattern can be repositioned and reshaped without mechanical movement. This parameter change enables rapid, programmable control of pattern position and shape, improving ease of operation
2Productivity
If physical masks are used for pattern generation, then the pattern can be projected onto the sample, but mask replacement is required when changing patterns, increasing time consumption
Solution Approach 1:
The patent replaces physical masks with a spatial light modulator that generates patterns through optical field modulation. The SLM can dynamically change patterns by adjusting the phase and amplitude of light waves according to programmable instructions, eliminating the need for physical mask replacement and enabling rapid pattern changes
Solution Approach 2:
The patent transitions from static physical masks to a dynamic spatial light modulator. The SLM can change patterns in real-time based on control signals, allowing flexible and rapid pattern adjustment without the time-consuming process of physically replacing masks. This dynamic control significantly improves productivity
3Measurement precision
If a mechanical carriage system is implemented for mask positioning, then spatial phase adjustment is achieved, but the device size increases, preventing miniaturization
Solution Approach 1:
The patent replaces the mechanical carriage positioning system with a spatial light modulator that achieves spatial phase adjustment through optical field control. The SLM modulates the phase of light waves directly, eliminating the need for mechanical movement components and reducing the overall device volume while maintaining precise spatial phase control
Solution Approach 2:
The patent transitions from one-dimensional mechanical displacement to multi-dimensional optical phase modulation. The SLM controls the phase of light waves in the optical domain, allowing precise spatial phase adjustment without requiring physical displacement in real space. This dimensional transition enables miniaturization of the device
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables easy imaging of objects with desired patterns and phase movement, reducing the need for mechanical components and allowing for miniaturization of the imaging device while maintaining high image quality.
Implementation Method 1
a light modulation element configured to generate measurement light having an arbitrary pattern from the light emitted by the first light projecting section
Data Source
AI summary
To provide a microscopic imaging device in which a measuring object can be easily imaged using measurement light having a desired pattern, in which the pattern of measurement light can be changed and a phase of the pattern can be moved, without arranging a mechanical mechanism. An arbitrary pattern of a plurality of patterns of measurement light is instructed. The measurement light having an instructed pattern is generated by a light modulation element, and is applied on a measuring object. A spatial phase of the generated pattern is sequentially moved on the measuring object by a predetermined amount by the light modulation element. A plurality of pieces of pattern image data generated at a plurality of phases of the pattern is synthesized based on the light receiving signal output from the light receiving section to generate sectioning image data indicating an image of the measuring object.