Semiconductor Light Receiving Element Capacitance Reduction
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Solution Overview
Problem
Existing semiconductor light receiving elements face challenges in reducing capacitance between electrodes while minimizing the increase in carrier travel time, as previous methods either fail to sufficiently reduce capacitance or result in increased carrier travel time due to thick buffer layers.
Innovation Solution
Incorporating an oxidation layer with a non-oxidation region and an oxidation region in the light absorbing layer or between conductivity type layers, where the oxidation region has a lower dielectric constant than the light absorbing layer, formed by selectively oxidizing a layer with a higher oxidation rate material from the side face, thereby reducing capacitance without thickening the oxidation region.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of energy
If the light absorbing layer is made thick to reduce capacitance, then capacitance between electrodes is reduced, but carrier travel time increases
Solution Approach 1:
The light absorbing layer is segmented into multiple thinner layers (first light absorbing layer and second light absorbing layer) with a buffer layer and oxidation layer inserted between them. This segmentation allows the total light absorption function to be distributed across multiple layers, reducing the capacitance of each individual layer while maintaining the overall light absorption efficiency, thereby reducing total capacitance without significantly increasing carrier travel time.
Solution Approach 2:
A buffer layer and oxidation layer are inserted as intermediary layers between the first and second light absorbing layers. The buffer layer provides electrical isolation and the oxidation layer (with lower dielectric constant) reduces capacitance between the light absorbing layers. These intermediary layers enable the light absorbing layer to be effectively divided without directly connecting the electrodes, thus reducing capacitance while minimizing impact on carrier travel time.
2Productivity
If the light absorbing layer area is increased to improve light conversion efficiency, then photocurrent conversion efficiency is improved, but capacitance increases
Solution Approach 1:
The light absorbing layer is divided into multiple segments (first and second light absorbing layers) separated by buffer and oxidation layers. This segmentation allows each segment to have optimized dimensions that balance light absorption area with capacitance reduction, enabling high photocurrent conversion efficiency while keeping total capacitance low.
Solution Approach 2:
Instead of increasing the in-plane area of the light absorbing layer to improve conversion efficiency, the patent introduces a vertical dimension by stacking multiple light absorbing layers with intervening buffer and oxidation layers. This vertical stacking allows the effective light absorption area to be increased through multiple layers while the capacitance between layers is reduced by the low-dielectric-constant oxidation layer, thus improving conversion efficiency without proportionally increasing capacitance.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively reduces capacitance while minimizing the increase in carrier travel time, enabling high-speed response and high-capacity communication in optical communication systems.
Implementation Method 1
a dielectric constant of the oxidation region in the oxidation layer is sufficiently lower than the dielectric constant of the light absorbing layer
Implementation Method 2
formed by selectively oxidizing a layer with a higher oxidation rate material from the side face
Data Source
AI summary
The present invention provides a semiconductor light receiving element capable of reducing capacity while minimizing increase in travel time of carriers. The semiconductor light receiving element includes a semiconductor stacked structure including a first conductivity type layer, a light absorbing layer, and a second conductivity type layer having a light incidence plane in order. The semiconductor light receiving element has an oxidation layer including a non-oxidation region and an oxidation region in a stacking in-plane direction in the light absorbing layer or between the first conductivity type layer and the light absorbing layer.


