Light Scanning Optics with Sagittal Tilt for Uniform Scanning
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Solution Overview
Problem
Conventional light scanning apparatuses experience image quality deterioration due to deviations in scanning widths of multiple beams, which are not adequately addressed by existing methods.
Innovation Solution
The apparatus employs a deflecting unit, a first element, and an incident system configured to satisfy specific conditions, including inequalities involving distances, lateral magnifications, and sagittal line tilt amounts, to control the deviation of light beams on the scanned surface.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple beams are emitted from a light source with multiple light emitting points to increase scanning speed, then productivity is improved, but manufacturing precision deteriorates due to deviation between scanning widths of the multiple beams
Solution Approach 1:
The patent applies local quality by making the first surface of the optical element have different inclinations at different positions. Specifically, the surface inclination varies depending on where light fluxes from different light emitting points arrive, allowing each region to compensate for local deviations in scanning width. This non-uniform surface design ensures that light fluxes from multiple light emitting points converge at appropriate positions on the scanned surface, maintaining uniform scanning widths across all beams while preserving the high-speed scanning capability provided by multiple light emitting points
2Volume of moving object
If the scanning apparatus is downsized, then device complexity is reduced and portability improved, but measurement precision deteriorates due to increased beam deviation
Solution Approach 1:
The patent employs parameter changes by carefully controlling the inclination angles of the first surface of the optical element. By optimizing these geometric parameters, the system achieves effective beam convergence and scanning width uniformity in a compact configuration. The specific inclination angles are designed to compensate for beam deviations that would normally require larger optical paths, thereby maintaining high measurement precision while enabling apparatus downsizing
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration reduces beam width deviations, enhancing image quality and enabling downsizing while maintaining high definition.
Implementation Method 1
a deflecting unit (1) configured to deflect a plurality of light fluxes (LG) from a light source (1101)
Implementation Method 2
a first optical element (1106) configured to guide the plurality of light fluxes (LG) deflected by a first deflecting surface (1a) of the deflecting unit (1) to a scanned surface (1108)
Data Source
AI summary
Provided is an apparatus in which a distance between a light source and a deflecting surface of a deflecting unit on an optical axis of an incident system, a distance between the deflecting surface and a sagittal line tilt surface of an imaging element on an optical axis of the imaging element, a lateral magnification in a sub-scanning cross section of the incident system, and an inclination of the sagittal line tilt surface at a position at which a light flux from each light emitting point of the light source arrives on the sagittal line tilt surface are appropriately set.